Zobrazeno 1 - 10
of 51
pro vyhledávání: '"Kookjin Lee"'
Autor:
Kookjin Lee, Sangjin Nam, Hyunjin Ji, Junhee Choi, Jun-Eon Jin, Yeonsu Kim, Junhong Na, Min-Yeul Ryu, Young-Hoon Cho, Hyebin Lee, Jaewoo Lee, Min-Kyu Joo, Gyu-Tae Kim
Publikováno v:
npj 2D Materials and Applications, Vol 5, Iss 1, Pp 1-9 (2021)
Abstract Two-dimensional (2D) layered materials such as graphene, molybdenum disulfide (MoS2), tungsten disulfide (WSe2), and black phosphorus (BP) provide unique opportunities to identify the origin of current fluctuation, mainly arising from their
Externí odkaz:
https://doaj.org/article/3e001124cfbe40af8b42a1050b945580
Publikováno v:
PLoS ONE, Vol 16, Iss 7, p e0254319 (2021)
In this paper we investigate the utility of one-dimensional convolutional neural network (CNN) models in epidemiological forecasting. Deep learning models, in particular variants of recurrent neural networks (RNNs) have been studied for ILI (Influenz
Externí odkaz:
https://doaj.org/article/9a39ca67b96c4b9d9f34bda94007bbe8
Publikováno v:
Knowledge and Information Systems. 65:2403-2427
Publikováno v:
ACS Applied Electronic Materials. 4:5184-5190
Autor:
Bedřich Sousedík, Kookjin Lee
Publikováno v:
SIAM/ASA Journal on Uncertainty Quantification. 10:1101-1129
We present a method for linear stability analysis of systems with parametric uncertainty formulated in the stochastic Galerkin framework. Specifically, we assume that for a model partial differential equation, the parameter is given in the form of ge
Autor:
Kookjin Lee, Ben Kaczer, Anastasiia Kruv, Mario Gonzalez, Geert Eneman, Oguzhan Orkut Okudur, Alexander Grill, Ingrid De Wolf
Publikováno v:
IEEE Transactions on Electron Devices. 69:5382-5385
Neural networks (NNs) enable precise modeling of complicated geophysical phenomena but are sensitive to small input changes. In this work, we present a new method for analyzing this instability in NNs. We focus our analysis on adversarial examples, t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ea266f68b2fca9d60d47efe867458c2
https://doi.org/10.31223/x5d954
https://doi.org/10.31223/x5d954
Autor:
Kookjin Lee, Ben Kaczer, Anastasiia Kruv, Mario Gonzalez, Geert Eneman, Oguzhan Orkut Okudur, Alexander Grill, Ingrid De Wolf
Publikováno v:
IEEE Transactions on Electron Devices. 69:2214-2217
Publikováno v:
BIT Numerical Mathematics. 62:965-994
Autor:
Stanislav Tyaginov, A. Grill, Kookjin Lee, Robin Degraeve, Mario Gonzalez, Ingrid De Wolf, Anastasiia Kruv, Ben Kaczer
Publikováno v:
IEEE Electron Device Letters. 42:1424-1427
Hot-carrier-induced degradation of short p-channel field-effect transistors in the presence of externally applied vertical mechanical force is investigated. The mechanical stress was induced in the devices by applying a normal load with a nanoindente