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Guided Heterostructure Growth of CoFe LDH on Ti 3 C 2 T x MXene for Durably High Oxygen Evolution Activity.

Autor: Sheng J; Department of Applied Physics, Aalto University, ESPOO, FIN-02150, Finland., Kang J; Department of Applied Physics, Aalto University, ESPOO, FIN-02150, Finland., Jiang P; Department of Applied Physics, Aalto University, ESPOO, FIN-02150, Finland.; Research Institute of Wood Industry, Chinese Academy of Forestry, Xiangshan Road, Beijing, 100091, China., Meinander K; Department of Bioproducts and Biosystems, Aalto University, Espoo, FIN-02150, Finland., Hong X; Department of Applied Physics, Aalto University, ESPOO, FIN-02150, Finland., Jiang H; Department of Applied Physics, Aalto University, ESPOO, FIN-02150, Finland., Nonappa; Faculty of Engineering and Natural Sciences, Tampere University, Tampere, FI-33101, Finland., Ikkala O; Department of Applied Physics, Aalto University, ESPOO, FIN-02150, Finland., Komsa HP; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, Oulu, FIN-90014, Finland., Peng B; Department of Applied Physics, Aalto University, ESPOO, FIN-02150, Finland.; Department of Materials Science, Advanced Coating Research Center of Ministry of Education of China, Fudan University, Shanghai, 200433, China., Lv ZP; Department of Applied Physics, Aalto University, ESPOO, FIN-02150, Finland.

Publikováno v: Small (Weinheim an der Bergstrasse, Germany) [Small] 2024 Sep 10, pp. e2404927. Date of Electronic Publication: 2024 Sep 10.

Identification of Material Dimensionality Based on Force Constant Analysis.

Autor: Bagheri M; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, Oulu FIN-90014, Finland., Berger E; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, Oulu FIN-90014, Finland., Komsa HP; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, Oulu FIN-90014, Finland.

Publikováno v: The journal of physical chemistry letters [J Phys Chem Lett] 2023 Sep 07; Vol. 14 (35), pp. 7840-7847. Date of Electronic Publication: 2023 Aug 25.

Highly Selective H 2 S Gas Sensor Based on Ti 3 C 2 T x MXene-Organic Composites.

Autor: Hosseini-Shokouh SH; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P.O. Box 4500, FIN-90014Oulu, Finland., Zhou J; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P.O. Box 4500, FIN-90014Oulu, Finland., Berger E; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P.O. Box 4500, FIN-90014Oulu, Finland., Lv ZP; Department of Applied Physics, Aalto University, FIN-00076Aalto, Finland., Hong X; Department of Applied Physics, Aalto University, FIN-00076Aalto, Finland., Virtanen V; Research Unit of Medical Imaging, Physics and Technology, Faculty of Medicine, University of Oulu, Aapistie 5A, 90220Oulu, Finland., Kordas K; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P.O. Box 4500, FIN-90014Oulu, Finland., Komsa HP; Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P.O. Box 4500, FIN-90014Oulu, Finland.

Publikováno v: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2023 Feb 08; Vol. 15 (5), pp. 7063-7073. Date of Electronic Publication: 2023 Jan 24.

Stacking Fault Induced Symmetry Breaking in van der Waals Nanowires.

Autor: Sutter E; Department of Mechanical and Materials Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska68588, United States.; Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, Nebraska68588, United States., Komsa HP; Faculty of Information Technology and Electrical Engineering, University of Oulu, FI-90014, Oulu, Finland., Puretzky AA; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee37830, United States., Unocic RR; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee37830, United States., Sutter P; Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska68588, United States.

Publikováno v: ACS nano [ACS Nano] 2022 Dec 27; Vol. 16 (12), pp. 21199-21207. Date of Electronic Publication: 2022 Nov 22.