Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Kom Kammeugne, Roméo"'
Autor:
Kom Kammeugne, Roméo
Publikováno v:
Micro et nanotechnologies/Microélectronique. Université Grenoble Alpes [2020-..], 2022. Français. ⟨NNT : 2022GRALT039⟩
This thesis presents a thorough analysis of the mechanisms controlling the GaN MIS-HEMT device performances through electrical characterization. To this end, a specific effort is made to understand how the devices work. First, new characterization me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::84e5551460b327a5e9a8374f31a7eb29
https://theses.hal.science/tel-03828057
https://theses.hal.science/tel-03828057
Autor:
Mota Frutuoso, Tadeu, Garros, Xavier, Lugo-Alvarez, José, Kom Kammeugne, Roméo, Mohgouk Zouknak, Louis David, Viey, Abygaël, Vandendaele, William, Ferrari, Philippe, Gaillard, Fred
Publikováno v:
IEEE International Reliability Physics Symposium (IRPS 2022)
IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, United States. ⟨10.1109/IRPS48227.2022.9764550⟩
IEEELink
IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, United States. ⟨10.1109/IRPS48227.2022.9764550⟩
IEEELink
International audience; Two Ultra-Fast capacitance characterization methods based on the displacement current measure are explored for MOS capacitance devices. The first method measure the variation of charge obtained from several 100ns short pulses
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13a5e89e482ad964495f897e131baddb
https://doi.org/10.1109/irps48227.2022.9764550
https://doi.org/10.1109/irps48227.2022.9764550
