Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Kolos Lin"'
Autor:
Mohamed Ridane, Ivy Chen, Sung-Min Song, Peter Nikolsky, Kuan-Ming Chen, Shinyeong Lee, Sean Park, Kolos Lin, Yu-Chi Su, Kyoyeon Cho, Ethan Yu, James Park, Abdalmohsen Elmalk, Chih-Hung Hsieh, Alexander Serebryakov, Lei Zhang, Taekwon Jee, Joonsang You, Hong Goo Lee, Jongmin Park, Jungchan Kim, Sang-Woo Kim, Seungmo Hong, Jaewook Seo
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4173ba55903306cd5d159770a3c1ca31
https://doi.org/10.1117/12.2659692
https://doi.org/10.1117/12.2659692
Autor:
Fang Wei, Chenming Zhang, Honglin Meng, Zhihao Chu, Chao Huang, Lin Wu, Han Chen, Daquan He, Lulu Chen, Donghan Jin, Elly Shi, Robbin Zhu, Shane Su, Pei Wang, Hong Wei Zhang, Kai Yuan Chi, Xuechen Zhu, Kolos Lin, Peja Lee, Selena Chen, Abdalmohsen Elmalk, Andy Zhang, Leon Liang
Publikováno v:
2021 International Workshop on Advanced Patterning Solutions (IWAPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f4b96459e2a740a968a409a186b7216
https://doi.org/10.1109/iwaps54037.2021.9671249
https://doi.org/10.1109/iwaps54037.2021.9671249
Autor:
Kan Zhou, Xin Guo, Yuyang Bian, Wenzhan Zhou, Yu Zhang, Ijen van Mil, Elly Shi, Robbin Zhu, Jo Zhu, Ivan Mao, Elvira Koolen, Kaiyuan Chi, Jose Carlos Font Trinchant, Gratiela Isai, Selena Chen, Jing Wang, Pei Wang, Shane Su, Xuechen Zhu, Kolos Lin, Kelvin Pao, Koen Thuijs, Peja Lee, Abdalmohsen Elmalk, Sudharshanan Raghunathan, Andy Zhang, Leon Liang, Xander Wang, Gary Zhang
Publikováno v:
2021 International Workshop on Advanced Patterning Solutions (IWAPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::72f72295ee02e96ab1c0f80e10d684ae
https://doi.org/10.1109/iwaps54037.2021.9671240
https://doi.org/10.1109/iwaps54037.2021.9671240