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Autor:
Cantoro, Riccardo, Garau, Francesco, Girard, Patrick, Kolahimahmoudi, Nima, Sartoni, Sandro, Reorda, Matteo Sonza, Virazel, Arnaud
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
In-field test of integrated circuits using Self-Test Libraries (STLs) is a widely used technique specifically suited to guarantee the processor’s correct behavior during the operative lifetime, as mandated by functional safety standards such as ISO
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c74bbe9c6ae2211e3201fbc7b9994f30
https://hdl.handle.net/2117/372132
https://hdl.handle.net/2117/372132
