Zobrazeno 1 - 10
of 33
pro vyhledávání: '"Koji Shiozaki"'
Publikováno v:
AIP Advances, Vol 10, Iss 6, Pp 065215-065215-5 (2020)
Hafnium silicate (HfSiOx) has been applied to AlGaN/GaN high-electron-mobility transistors (HEMTs) as a high κ gate dielectric. The (HfO2)/(SiO2) laminate structure was deposited on the AlGaN surface by a plasma-enhanced atomic layer deposition, fol
Externí odkaz:
https://doaj.org/article/7a555c14c590414aa052ec0cd678980c
Publikováno v:
IEEJ Journal of Industry Applications.
Autor:
Kazuhito Tsukagoshi, Toshihide Nabatame, Takashi Onaya, Mari Inoue, Koji Shiozaki, Tamotsu Hashizume, Tomomi Sawada, Ryota Ochi, Yasuo Koide, Erika Maeda, Masafumi Hirose, Yoshihiro Irokawa
Publikováno v:
ECS Transactions. 104:113-120
Publikováno v:
2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia).
Autor:
Toshihide Nabatame, Erika Maeda, Yasuo Koide, Yoshihiro Irokawa, Mari Inoue, Hajime Kiyono, Koji Shiozaki, Masafumi Hirose
Publikováno v:
ECS Transactions. 92:109-117
We systematically investigated characteristics of Pt-gated capacitors with four kinds of gate insulators such as Hf0.57Si0.43Ox, Hf0.64Si0.36Ox, HfO2, and Al2O3. The Hf0.64Si0.36Ox films fabricated by post-deposition annealing (PDA) at 800°C in O2 (
Autor:
Ryota Ochi, Erika Maeda, Toshihide Nabatame, Yasuo Koide, Tamotsu Hashizume, Yoshihiro Irokawa, Mari Inoue, Koji Shiozaki
Publikováno v:
2021 20th International Workshop on Junction Technology (IWJT).
Gallium nitride (GaN) high-electron-mobility transistor (HEMT) and vertical GaN metal-oxide-semiconductor (MOS) devices have potential application to high power and high frequency because of their superior characteristics, such as wide band gap (B g
Autor:
Hiroyasu Akatuka, Shota Hori, Shen Wang, Shinji Doki, Hiroshi Tadano, Koji Shiozaki, Yasuki Kanazawa
Publikováno v:
ICIT
This paper aims to propose a control method of a high efficiency electric vehicles(EVs) drive motor and to verify its effectiveness. One of the ways to extend the driving distance is to improve the efficiency of the motor control system. However, exi
Publikováno v:
Gallium Nitride Materials and Devices XVI.
We have investigated AlGaN/GaN high-electron mobility transistors (HEMTs) with a high κ gate dielectric using hafnium silicate (HfSiOx). The (HfO2)/(SiO2) laminate structure was deposited on the AlGaN surface by a plasma enhanced atomic layer deposi
Publikováno v:
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe).
GaN power conversion circuits need to avoid overheating. This paper describes the design of inverter circuits including GaN power devices, focusing on dual cooling systems. and proposes DC-DC converter circuit which achieves the operation of up to 13
Autor:
Daigo Kikuta, Kenji Shiraishi, Atsushi Oshiyama, Koji Shiozaki, Kenta Chokawa, Tetsu Kachi, Tetsuo Narita
Publikováno v:
Physical Review Applied. 14
We report density-functional calculations that clarify the atomic and electronic structures of the oxygen vacancy ${V}_{\mathrm{O}}$ in amorphous $({\mathrm{Al}}_{2}{\mathrm{O}}_{3}{)}_{1\ensuremath{-}x}({\mathrm{Si}\mathrm{O}}_{2}{)}_{x}$ mixed oxid