Zobrazeno 1 - 10
of 112
pro vyhledávání: '"Koichiro Hoh"'
Publikováno v:
Japanese Journal of Applied Physics. 41:2329-2334
A novel complementary-metal-oxide-semiconductor (CMOS) processor labelled quantum-circuit processor (QCP) for the high-performance emulation of quantum computing is presented. The QCP performs the emulation of the calculation performed in the quantum
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 121:488-491
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 121:499-508
Publikováno v:
Journal of Physics: Condensed Matter. 12:7223-7228
The effect of a tunnelling electron on the tunnel barrier shape is studied at the limit where a static image charge model is applicable. It is shown that the single-electron tunnelling current through an ultrasmall voltage-biased junction is not prop
Publikováno v:
Systems and Computers in Japan. 30:106-115
Publikováno v:
Computers & Electrical Engineering. 24:43-61
We have found chaotic responses observed in the capacitance–npn-transistor pair and have clarified its mathematical characteristics and physical mechanism. It is a very simple circuit compared with any chaos-generating circuits ever proposed and ca
Publikováno v:
Denki Kagaku oyobi Kogyo Butsuri Kagaku. 63:460-465
Publikováno v:
Japanese Journal of Applied Physics. 42:2182-2184
A 16-qubit quantum-computing emulator executing quantum algorithms at high speed is proposed. By limiting the command of the quantum computing emulator to the minimum function required with the quantum algorithm, probability amplitudes are expressed
Autor:
Koichiro Hoh, Yoh Yasuda
Publikováno v:
Electronics and Communications in Japan (Part III: Fundamental Electronic Science). 77:107-115
Chaotic behaviors are observed in the anode current of the thyristors where their anodes were excited with an ac source and the constant dc current was supplied to the gate. Three aspects of chaos, i.e., period-doubling bifurcation, intermittency, an
Publikováno v:
Hyomen Kagaku. 12:291-297
Small-signal AC resistance and DC resistance of evaporated pure Al interconnection were measured under the DC current stress which envokes electromigration. AC resistance weakly depends on frequency and increases as the frequency is lowered. This is