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pro vyhledávání: '"Kodie Altvater"'
Autor:
Paul Dudek, Kodie Altvater, Douglas Jaeger, John Lindley, Brainton Song, James Hack, Deas Brown, Thomas Tittel, Ellwood Lane
Publikováno v:
2016 IEEE Radiation Effects Data Workshop (REDW).
This paper describes the methodology and test results from heavy ion and proton testing of the Micron 4 Gb NAND flash memory, with particular attention to characterization of the transient high current effect previously observed.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b56351d9e23861690897929654716cfa
https://doi.org/10.1109/nsrec.2016.7891716
https://doi.org/10.1109/nsrec.2016.7891716
