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pro vyhledávání: '"Kobi Danon"'
Autor:
Kobi Danon, Unsoon Kim, Shiva Shetty, Tim Thurgate, Stefano Amato, Yu Sun, Yoram Betser, P.K. Singh, Amichai Givant, Inkuk Kang, Jonas Neo, Kuo-Tung Chang, Chun Chen, James Pak, Amy Tu
Publikováno v:
2018 IEEE International Memory Workshop (IMW).
Key attributes of Embedded Charge Trap (eCTTM) Flash technology are presented. Automotive MCUs with 40nm eCT Flash are currently in volume production at UMC. The eCT technology features industry-leading cell size at the 40nm node, and scaling by more