Zobrazeno 1 - 10
of 743
pro vyhledávání: '"Ko EK"'
Publikováno v:
Jurnal Engineering; Vol. 4 No. 1 (2022): Volume 4, Nomor 1, Januari 2022; 18-24
Kegiatan pemanfaatan lahan gambut dengan cara membakar dan membuat kanal tanpa penerapan sekat kanal menyebabkan muncul banyaknya titik kebakaran, khususnya ketika musim kemarau tiba. Hal ini dapat menyebabkan turunnya kualitas udara ambien yang dise
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::29523f2df09611e7e73d1dcee1a028c9
https://doi.org/10.22437/jurnalengineering.v4i1.16581
https://doi.org/10.22437/jurnalengineering.v4i1.16581
Autor:
Brakta S; Section of Reproductive Endocrine, Infertility, & Genetics, Department of Obstetrics & Gynecology, Medical College of Georgia at Augusta University, Augusta, GA, USA. Electronic address: sbrakta@augusta.edu., Du Q; Department of Neuroscience and Regenerative Medicine, Medical College of Georgia at Augusta University, Augusta, GA, USA., Chorich LP; Section of Reproductive Endocrine, Infertility, & Genetics, Department of Obstetrics & Gynecology, Medical College of Georgia at Augusta University, Augusta, GA, USA., Hawkins ZA; Section of Reproductive Endocrine, Infertility, & Genetics, Department of Obstetrics & Gynecology, Medical College of Georgia at Augusta University, Augusta, GA, USA., Sullivan ME; University of Pittsburgh, Pittsburgh, PA, USA., Ko EK; University of Pennsylvania, Philadelphia, PA, USA., Kim HG; Department of Neurosurgery, Robert Wood Johnson Medical School, Rutgers, The State University of New Jersey, Piscataway, NJ, USA., Knight J; Department of Genetics, Yale University School of Medicine, New Haven, CT, USA; Yale Center for Genome Analysis, Yale University, New Haven, CT, USA., Taylor HS; Department of Obstetrics, Gynecology and Reproductive Sciences, Yale University School of Medicine, New Haven, CT, USA., Friez M; Greenwood Genetics Center, Greenwood, SC, USA., Phillips JA 3rd; Division of Medical Genetics and Genomic Medicine, Department of Pediatrics, Vanderbilt University, Nashville, TN, USA., Layman LC; Section of Reproductive Endocrine, Infertility, & Genetics, Department of Obstetrics & Gynecology, Medical College of Georgia at Augusta University, Augusta, GA, USA; Department of Neuroscience and Regenerative Medicine, Medical College of Georgia at Augusta University, Augusta, GA, USA; Department of Physiology, Medical College of Georgia at Augusta University, Augusta, GA, USA.
Publikováno v:
Molecular and cellular endocrinology [Mol Cell Endocrinol] 2024 Aug 01; Vol. 589, pp. 112237. Date of Electronic Publication: 2024 Apr 08.
Autor:
Ko EK; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Anderson A; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., D'souza C; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Zou J; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Huang S; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Penn Institute of Biomedical Informatics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Cho S; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Alawi F; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Penn School of Dental Medicine, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Prouty S; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Lee V; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Department of Ophthalmology, Scheie Eye Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Yoon S; Department of Genetics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Krick K; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Horiuchi Y; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA., Ge K; National Institute of Diabetes and Digestive and Kidney Diseases, National Institute of Health, Bethesda, MD 20892, USA., Seykora JT; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Abramson Cancer Center, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Capell BC; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA, USA; Department of Genetics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA; Abramson Cancer Center, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA; Penn Institute for Regenerative Medicine, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA. Electronic address: capellb@pennmedicine.upenn.edu.
Publikováno v:
Developmental cell [Dev Cell] 2024 Jan 22; Vol. 59 (2), pp. 187-198.e7. Date of Electronic Publication: 2024 Jan 09.
Autor:
Maldonado López AM; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Ko EK; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Huang S; Penn Institute of Biomedical Informatics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Pacella G; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Kuprasertkul N; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., D'souza CA; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Reyes Hueros RA; Department of Biochemistry and Biophysics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Shen H; Department of Biochemistry and Biophysics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Stoute J; Department of Biochemistry and Biophysics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Elashal H; Department of Biochemistry and Biophysics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Sinkfield M; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Anderson A; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Prouty S; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Li HB; Shanghai Institute of Immunology, Shanghai Jiao Tong University School of Medicine, Shanghai, China.; Institute for Immune Metabolism, Shanghai Jiao Tong University School of Medicine-Yale University, Shanghai, China., Seykora JT; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Abramson Cancer Center, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Liu KF; Department of Biochemistry and Biophysics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Institute for Regenerative Medicine, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA., Capell BC; Department of Dermatology, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Epigenetics Institute, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Abramson Cancer Center, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Penn Institute for Regenerative Medicine, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.; Department of Genetics, University of Pennsylvania Perelman School of Medicine, Philadelphia, PA 19104, USA.
Publikováno v:
Science advances [Sci Adv] 2023 Sep; Vol. 9 (35), pp. eadg5234. Date of Electronic Publication: 2023 Sep 01.
Autor:
Ko EK; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea., Hahn S; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea.; Research Institute of Basic Sciences (RIBS), Seoul National University, Seoul, 08826, Republic of Korea., Sohn C; Department of Physics, Ulsan National Institute of Science and Technology, Ulsan, Republic of Korea., Lee S; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea., Lee SB; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea.; Center for Theoretical Physics, Seoul National University, Seoul, 08826, Republic of Korea., Sohn B; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea., Kim JR; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea., Son J; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea., Song J; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea., Kim Y; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea., Kim D; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea., Kim M; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea., Kim CH; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea. chkim82@snu.ac.kr.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea. chkim82@snu.ac.kr., Kim C; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea. changyoung@snu.ac.kr.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea. changyoung@snu.ac.kr., Noh TW; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea. twnoh@snu.ac.kr.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea. twnoh@snu.ac.kr.
Publikováno v:
Nature communications [Nat Commun] 2023 Jun 16; Vol. 14 (1), pp. 3572. Date of Electronic Publication: 2023 Jun 16.
Autor:
Roh CJ; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea., Ko EK; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea., Chang Y; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea., Park SH; Pohang Accelerator Laboratory, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea., Mun J; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea., Kim M; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea., Noh TW; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea.
Publikováno v:
ACS nano [ACS Nano] 2023 May 09; Vol. 17 (9), pp. 8233-8241. Date of Electronic Publication: 2023 Apr 24.
Autor:
Kim JR; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Sohn B; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea.; Department of Applied Physics, Yale University, New Haven, CT, 06520, USA., Lee HJ; Center for Theoretical Physics of Complex Systems, Institute for Basic Science (IBS), Daejeon, 34126, South Korea., Lee S; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, South Korea., Ko EK; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Hahn S; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Lee S; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea., Kim Y; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Kim D; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Kim HJ; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Kim Y; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Son J; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Ahn CH; Department of Applied Physics, Yale University, New Haven, CT, 06520, USA.; Department of Physics, Yale University, New Haven, CT, 06520, USA., Walker FJ; Department of Applied Physics, Yale University, New Haven, CT, 06520, USA., Go A; Department of Physics, Chonnam National University, Gwangju, 61186, South Korea., Kim M; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, South Korea., Kim CH; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Kim C; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea., Noh TW; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2023 Apr; Vol. 35 (15), pp. e2208833. Date of Electronic Publication: 2023 Mar 06.
Autor:
Mun J; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul08826, Republic of Korea.; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul08826, Republic of Korea., Ko EK; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul08826, Republic of Korea., Kang B; Department of Physics, Ulsan National Institute of Science and Technology, Ulsan44919, Republic of Korea., Gil B; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul08826, Republic of Korea., Kim CH; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul08826, Republic of Korea., Hahn S; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul08826, Republic of Korea., Song J; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul08826, Republic of Korea., Zhu Y; Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York11973, United States., Sohn C; Department of Physics, Ulsan National Institute of Science and Technology, Ulsan44919, Republic of Korea., Noh TW; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul08826, Republic of Korea.; Department of Physics and Astronomy, Seoul National University, Seoul08826, Republic of Korea., Kim M; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul08826, Republic of Korea.; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul08826, Republic of Korea.
Publikováno v:
Nano letters [Nano Lett] 2023 Feb 08; Vol. 23 (3), pp. 1036-1043. Date of Electronic Publication: 2023 Jan 30.
Autor:
Song J; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Korea., Oh T; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Korea.; Center for Theoretical Physics (CTP), Seoul National University, Seoul, 08826, Korea., Ko EK; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Korea., Lee JH; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Korea., Kim WJ; Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA, 94025, USA.; Department of Applied Physics, Stanford University, Stanford, CA, 94305, USA., Zhu Y; School of Physics, Shandong University, Jinan, 250100, China., Yang BJ; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Korea.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Korea.; Center for Theoretical Physics (CTP), Seoul National University, Seoul, 08826, Korea., Li Y; School of Physics, Shandong University, Jinan, 250100, China. yangyang.li@sdu.edu.cn., Noh TW; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Korea. twnoh@snu.ac.kr.; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Korea. twnoh@snu.ac.kr.
Publikováno v:
Nature communications [Nat Commun] 2022 Oct 30; Vol. 13 (1), pp. 6501. Date of Electronic Publication: 2022 Oct 30.
Autor:
Zhu XD; Department of Physics and Astronomy, University of California, Davis, California 95616, USA., Ko EK; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea., Kimbell G; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, United Kingdom., Robinson J; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, United Kingdom.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2022 Sep 01; Vol. 93 (9), pp. 093101.