Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Knauss, Lee A."'
Publikováno v:
Electronic Device Failure Analysis. Feb2017, Vol. 19 Issue 1, p25-25. 1p.
Autor:
Myers, Tracy1 tracy.myers@ONsemi.com
Publikováno v:
Electronic Device Failure Analysis. Nov2012, Vol. 14 Issue 4, p30-30. 1p.
Autor:
Knauss, Lee1 knauss_lee@bah.com
Publikováno v:
Electronic Device Failure Analysis. Feb2022, Vol. 24 Issue 1, p43-43. 1p.
Autor:
Hattrick-Simpers, Jason R., Jun, Cui, Murakami, Makoto, Orozco, Antonio, Knauss, Lee, Booth, Robert J., Greve, Edward W., Lofland, Samuel E., Wuttig, Manfred, Takeuchi, Ichiro
Publikováno v:
In Applied Surface Science 2007 254(3):734-737
Autor:
Knauss, Lee1 Knauss_Lee@bah.com
Publikováno v:
Electronic Device Failure Analysis. Feb2021, Vol. 23 Issue 1, p36-37. 2p.
Autor:
Knauss, Lee knauss&395;lee@bah.com
Publikováno v:
Electronic Device Failure Analysis. Nov2021, Vol. 23 Issue 4, p45-46. 2p.
Autor:
Knauss, Lee1 knauss_lee@bah.com, Zhiyong Wang2 zhiyong.wang@maximintegrated.com
Publikováno v:
Electronic Device Failure Analysis. Nov2018, Vol. 20 Issue 4, p2-14. 2p.
Autor:
Zhiyong Wang1 zhiyong.wang@maximintegrated.com, Knauss, Lee2 lee.knauss@iarpa.gov, Hartfield, Cheryl3 cheryl.hartfield@outlook.com
Publikováno v:
Electronic Device Failure Analysis. Feb2017, Vol. 19 Issue 1, p2-24. 2p.
Autor:
Horwitz, James S., Chrisey, Douglas B., Carter, A. C., Chang, Wontae, Knauss, Lee A., Pond, Jeffrey M., Kirchoefer, Steven W., Korn, D., Qadri, Syen B.
Publikováno v:
Proceedings of SPIE; Nov1997, Issue 1, p238-246, 9p
Autor:
Chrisey, Douglas B., Dorsey, Paul C., Horwitz, James S., Knauss, Lee A., Auyeung, Raymond C. Y.
Publikováno v:
Proceedings of SPIE; Nov1996, Issue 1, p386-397, 12p