Zobrazeno 1 - 10
of 72
pro vyhledávání: '"Klemens, F.P."'
Autor:
Jones, C.D.W., Bolle, C.A., Ryf, R., Simon, M.E., Pardo, F., Aksyuk, V.A., Lai, W.Y.-C., Bower, J.E., Miner, J.F., Klemens, F.P., Cirelli, R.A., Sorsch, T.W., Ferry, E.J., Fetter, L.A., Pai, C.-S., Taylor, J.A., Vyas, B., Watson, G.P., Stekas, B., Baker, M.R., Papazian, A.R., Basavanhally, N.R., Mansfield, W.M., Kornblit, A., Keller, R.C., Gates, J.V., Ramirez, A.P.
Publikováno v:
In Sensors & Actuators: A. Physical 2009 155(1):47-57
Autor:
Pardo, Flavio, Cirelli, R.A., Ferry, E.J., Lai, W.Y.-C., Klemens, F.P., Miner, J.F., Pai, C.S., Bower, J.E., Mansfield, W.M., Kornblit, A., Sorsch, T.W., Taylor, J.A., Baker, M.R., Fullowan, R., Simon, M.E., Aksyuk, V.A., Ryf, R., Dyson, H., Arney, S.
Publikováno v:
In Microelectronic Engineering 2007 84(5):1157-1161
Publikováno v:
In Solid State Electronics 2002 46(7):939-950
Autor:
Cirelli, R.A., Bude, J., Houlihan, F., Gabor, A., Watson, G.P., Weber, G.R., Klemens, F.P., Sweeney, J., Mansfield, W.M., Nalamasu, O.
Publikováno v:
In Microelectronic Engineering 2000 53(1):87-90
Autor:
Sang-Hyun Oh, Hergenrother, J.M., Nigam, T., Monroe, D., Klemens, F.P., Kornblit, A., Mansfield, W.M., Baker, M.R., Barr, D.L., Baumann, F.H., Bolan, K.J., Boone, T., Ciampa, N.A., Cirelli, R.A., Eaglesham, D.J., Ferry, E.J., Fiory, A.T., Frackoviak, J., Garno, J.P., Gossmann, H.J.
Publikováno v:
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p65-68, 4p
Autor:
Chang, C.-P., Vuang, H.-H., Baker, M.R., Pai, C.S., Klemens, F.P., Miner, J.F., Mansfield, W.M., Kleiman, R.N., Kornbllit, A., Baumann, F.H., Rogers, S.N., Bude, M., Grazul, J.L., Lloyd, E.J., Frei, M., Sorsch, T.W., Cirelli, R., Ferry, E., Bolan, K., Barr, D.
Publikováno v:
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p53-56, 4p
Autor:
King, C.A., Frei, M.R., Mastrapasqua, M., Ng, K.K., Kim, Y.O., Johnson, R.W., Moinian, S., Martin, S., Cong, H.-I., Klemens, F.P., Tang, R., Nguyen, D., Hsu, T.-I., Campbell, T., Molloy, S.J., Fritzinger, L.B., Ivanov, T.G., Bourdelle, K.K., Lee, C., Chyan, Y.-F.
Publikováno v:
International Electron Devices Meeting 1999 Technical Digest (Cat No99CH36318); 1999, p565-568, 4p
Autor:
Hergenrother, J.M., Monroe, D., Klemens, F.P., Komblit, A., Weber, G.R., Mansfield, W.M., Baker, M.R., Baumann, F.H., Bolan, K.J., Bower, J.E., Ciampa, N.A., Cirelli, R.A., Colonell, J.I., Eaglesham, D.J., Frackoviak, J., Gossmann, H.J., Green, M.L., Hillenius, S.J., King, C.A., Kleiman, R.N.
Publikováno v:
International Electron Devices Meeting 1999 Technical Digest (Cat No99CH36318); 1999, p75-78, 4p
Autor:
Chang, C.P., Pai, C.S., Baumann, F.H., Liu, C.T., Rafferty, C.S., Pinto, M.R., Lloyd, E.J., Bude, M., Klemens, F.P., Miner, J.F., Cheung, K.P., Colonell, J.I., Lai, W.Y.C., Vaidya, H., Hillenius, S.J., Liu, R.C., Clemens, J.T.
Publikováno v:
International Electron Devices Meeting IEDM Technical Digest; 1997, p661-664, 4p
Autor:
Kohl, P.A., Bhusari, D.M., Wedlake, M., Case, C., Klemens, F.P., Miner, J., Byung-Chan Lee, Gutmann, R.J., Shick, R.
Publikováno v:
IEEE Electron Device Letters; Dec2000, Vol. 21 Issue 12, p557-559, 3p