Reduction-Induced Magnetic Behavior in LaFeO 3−δ Thin Films.

Autor: Arndt, Nathan D., Hershkovitz, Eitan, Shah, Labdhi, Kjærnes, Kristoffer, Yang, Chao-Yao, Balakrishnan, Purnima P., Shariff, Mohammed S., Tauro, Shaun, Gopman, Daniel B., Kirby, Brian J., Grutter, Alexander J., Tybell, Thomas, Kim, Honggyu, Need, Ryan F.

Publikováno v: Materials (1996-1944); Mar2024, Vol. 17 Issue 5, p1188, 12p

Uniaxial Néel vector control in perovskite oxide thin films by anisotropic strain engineering

Autor: Kjærnes, Kristoffer, Hallsteinsen, Ingrid, Chopdekar, R. V., Moreau, Magnus, Bolstad, Torstein, Svenum, Ingeborg-Helene, Selbach, Sverre Magnus, Tybell, Per Thomas Martin

Externí odkaz: https://hdl.handle.net/11250/2983439

Synthesis and characterization of (111)-oriented BaTiO3 thin films

Autor: Bolstad, Torstein, Kjærnes, Kristoffer, Raa, Kristoffer S., Takahashi, Ryota, Lippmaa, Mikk, Tybell, Per Thomas Martin

Externí odkaz: http://hdl.handle.net/11250/2590260

Reduction-Induced Magnetic Behavior in LaFeO 3-δ Thin Films.

Autor: Arndt ND; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA., Hershkovitz E; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA., Shah L; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA., Kjærnes K; Department of Electronic Systems, NTNU-Norwegian University of Science and Technology, 7491 Trondheim, Norway., Yang CY; Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu 300093, Taiwan., Balakrishnan PP; NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MA 20899, USA., Shariff MS; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA., Tauro S; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA., Gopman DB; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MA 20899, USA., Kirby BJ; NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MA 20899, USA., Grutter AJ; NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MA 20899, USA., Tybell T; Department of Electronic Systems, NTNU-Norwegian University of Science and Technology, 7491 Trondheim, Norway., Kim H; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA., Need RF; Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA.

Publikováno v: Materials (Basel, Switzerland) [Materials (Basel)] 2024 Mar 04; Vol. 17 (5). Date of Electronic Publication: 2024 Mar 04.