Zobrazeno 1 - 10
of 166
pro vyhledávání: '"Kiyoshi Endo"'
Autor:
Kiyoshi Endo, Tatsuya Hama, Atsushi Shibuya, Daisuke Miyai, Shoichi Komine, Daichi Fujino, Kuniaki Minami, Natsuki Yoshioka
Publikováno v:
Journal of Japan Society of Civil Engineers, Ser. A1 (Structural Engineering & Earthquake Engineering (SE/EE)). 76:174-179
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8ac6a5147e143af15713c38a59ca6d7
https://doi.org/10.2208/jscejseee.76.1_174
https://doi.org/10.2208/jscejseee.76.1_174
Autor:
Yasushi Shibata, Toru Hatayama, Masahide Matsuda, Tomosato Yamazaki, Yoji Komatsu, Kiyoshi Endo, Hiroyoshi Akutsu
Publikováno v:
Journal of perioperative practice.
The detailed epidemiology and mechanism of post-craniotomy headaches are not well understood. This study aimed to establish the actual clinical incidence and causes of post-craniotomy headaches. Suboccipital craniotomy surgeries performed in six inst
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fa19113aa41acdef678f93017c0c01e
https://pubmed.ncbi.nlm.nih.gov/35191330
https://pubmed.ncbi.nlm.nih.gov/35191330
Autor:
Sayaka Ito, Toshihiro Onitsuka, Hiroshi Kuroda, Natsuki Hasegawa, Hiroki Fukuda, Hiroo Gouda, Hideki Akino, Shiori Sonoki, Kiyoshi Endo, Takeshi Takayama, Keiichi Nagase, Norio Shirafuji
Publikováno v:
Regional Studies in Marine Science. 55:102527
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d0912a845d9341b7352f4284d913016
https://doi.org/10.1016/j.rsma.2022.102527
https://doi.org/10.1016/j.rsma.2022.102527
Autor:
Tatsuya Hama, Kiyoshi Endo, Daichi Fujino, Daisuke Miyai, Atsushi Shibuya, Kuniaki Minami, Natsuki Yoshioka, Syouichi Komine
Publikováno v:
Journal of Japan Society of Civil Engineers, Ser. A1 (Structural Engineering & Earthquake Engineering (SE/EE)). 75:257-265
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::211d0470e5cf5024a7073ae7985b4e4f
https://doi.org/10.2208/jscejseee.75.257
https://doi.org/10.2208/jscejseee.75.257
Autor:
Kiyoshi ENDO, Kuniaki MINAMI, Syouichi KOMINE, Daisuke MIYAI, Daichi FUJINO, Natsuki YOSHIOKA, Atsushi SHIBUYA, Tatsuya HAMA
Publikováno v:
Journal of Japan Society of Civil Engineers, Ser. A1 (Structural Engineering & Earthquake Engineering (SE/EE)). 75:305-310
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f5afff42c791212d1906a95a50df5445
https://doi.org/10.2208/jscejseee.75.305
https://doi.org/10.2208/jscejseee.75.305
Autor:
Takahiro Gotow, Chih-Yu Chang, Dae-Hwan Ahn, Mitsuru Takenaka, Kimihiko Kato, Shinichi Takagi, Chiaki Yokoyama, Kiyoshi Endo
Publikováno v:
ECS Transactions. 85:27-37
The technical challenges and viable technologies of tunneling MOSFETs (TFET) using III-V semiconductors are present in this paper. Device engineering indispensable in improving the performance of TFETs is summarized. In particular, the electrical cha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6ab0846db9e0a1b5b3c99027ff37f93
https://doi.org/10.1149/08508.0027ecst
https://doi.org/10.1149/08508.0027ecst
Autor:
Daisuke Miyai, Daichi Fujino, Tatsuya Hama, Natsuki Yoshioka, Atsushi Shibuya, Kuniaki Minami, Syouichi Komine, Kiyoshi Endo
Publikováno v:
Journal of Japan Society of Civil Engineers, Ser. A1 (Structural Engineering & Earthquake Engineering (SE/EE)). 74:280-289
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ae9887c257b1b363dd9552f8125f76e
https://doi.org/10.2208/jscejseee.74.280
https://doi.org/10.2208/jscejseee.74.280
Autor:
Masamichi Kinoshita, Takeshi Ishida, Shuich Nitta, Kiyoshi Endo, Osamu Fujiwara, Hiroaki Okajima
Publikováno v:
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI).
An air discharge immunity test for electronic equipment prescribed in the International Eelectrotechnical Commission (IEC) standard causes unstable testing reproducibility due to many factors such as the approach speed of an electrostatic discharge (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9cc8d0371307657d3a07faab494263a
https://doi.org/10.1109/isemc.2017.8078009
https://doi.org/10.1109/isemc.2017.8078009
Publikováno v:
Japanese Journal of Applied Physics. 58:SBBA05
The physical origin of hysteresis and reduction in sub-threshold slope (S.S.) of Si MOSFETs with atomic layer deposition (ALD) La2O3 as a gate insulator is experimentally examined through the electrical measurements of the time and temperature depend
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53a443c381e943e16612eeb8f9d20a2c
https://doi.org/10.7567/1347-4065/aafecf
https://doi.org/10.7567/1347-4065/aafecf
Supreme Court 10 June 2008 Case No.890 of 2006 Company Split and Liability of the Succeeding Company
Autor:
Kiyoshi, Endo
Publikováno v:
東洋法学 = Toyohogaku. 55(2):175-191
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=jairo_______::c1600e9bc89c3f34747b3fae4de568ad
http://id.nii.ac.jp/1060/00000836/
http://id.nii.ac.jp/1060/00000836/