Výsledky vyhledávání - "Kisteman, Aernout"

Conference

Best focus determination: bridging the gap between optical and physical topography.

Autor: Kahlenberg, Frank, Seltmann, Rolf, La Fontaine, Bruno M., Wirtz, René, Kisteman, Aernout, Vanneer, Roel N. M., Pieters, Marco

Publikováno v: Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65200Z-65200Z-8, 8p

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Conference

Lithographic performance of a dual-stage 0.93NA ArF step and scan system.

Autor: Rubingh, Rian, Moers, Marco, Suddendorf, Manfred, Vanoppen, Peter, Kisteman, Aernout, Thier, Michael, Blahnik, Vladan, Piper, Eckhard

Publikováno v: Proceedings of SPIE; Nov2005, Issue 1, p681-692, 12p

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Conference

Overlay advanced process control for foundry application.

Autor: Wan, Xudong, Zhou, Andy, Zhang, Fjord, Li, Jerry, Gu, Xiaolan, Mos, Evert C., Kisteman, Aernout, Wang, Vivien, Schuurhuis, Ron

Publikováno v: Proceedings of SPIE; Nov2004, Issue 1, p735-743, 9p

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Akademický článek

Comparison of penetration depth between two-photon excitation and single-photon excitation in imaging through turbid tissue media.

Autor: Gu, Min, Min Gu, Gan, Xiaosong, Xiaosong Gan, Kisteman, Aernout, Xu, Ming Gun, Ming Gun Xu

Publikováno v: Applied Physics Letters; 9/4/2000, Vol. 77 Issue 10, 3 Black and White Photographs, 1 Chart, 3 Graphs

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