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pro vyhledávání: '"Kissel, T.M."'
Autor:
Feggeler, J.C., Chen, C.-C., Chen, Y.C., Delavaux, J.-M.P., Heisman, F.L., Homsey, G.M., Kidorf, H.D., Kissel, T.M., Miller, J.L., Nagel, J.A., Nuyts, R., Park, Y.-K., Patterson, W.W.
Publikováno v:
Electronics Letters (Institution of Engineering & Technology); 07/04/1996, Vol. 32 Issue 14, p1314-1315, 2p