Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Kisoo Shin"'
Publikováno v:
2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Quality factor of resonators has been one of the most important parameters because it determines sensitivity of the device, espacially in the case of vacuum-packaged MEMS resonators. Typical energy loss mechanisms of vacuum-packaged MEMS resonator ar
Autor:
Chul Gi Ko, Chang Zoo Kim, Hyun-Beom Shin, Dong-Hwan Jun, Kisoo Shin, Ho Kwan Kang, Won-Kyu Park, Hogyoung Kim
Publikováno v:
JSTS:Journal of Semiconductor Technology and Science. 9:91-97
The performance of GaInP/GaAs tandem solar cells with AlInP growth temperatures of 680 ℃ and 700 ℃ on n-type GaAs (100) substrate with 2° and 6° tilt angles has been investigated. The series resistance and open circuit voltage of the fabricated
Publikováno v:
Materials Science and Engineering: A. 165:35-43
Cu-26.5Zn-4Al (wt.%) alloy (as a matrix) and each of three different Fe-based ferromagnetic alloy flakes (as a reinforcing material) were processed into three different composites via conventional cold compaction; this was followed by hot isostatic p
Publikováno v:
10th IEEE International Conference on Nanotechnology.
High resolution and high density direct e-beam writing process on a transparent insulating substrate for optical devices and biosensors is developed. In this research, we present successful sub-50 nm high density direct e-beam writing process using m
Publikováno v:
10th IEEE International Conference on Nanotechnology.
Photonic crystal structures with different shape air holes including triangles, squares, and circles were fabricated on top of blue GaN-based light emitting diodes using electron beam lithography and inductively coupled dry etching processes. Light e
Autor:
Alexander H. King, Kisoo Shin
Publikováno v:
Philosophical Magazine A. 63:1023-1033
We present calculations of dislocation spacing for grain boundaries in zinc and show that the spacings may be large enough to be resolved in transmission electron microscopy even at extreme deviations from ideal coincidence misorientations. This effe
Autor:
Alexander H. King, Kisoo Shin
Publikováno v:
Le Journal de Physique Colloques. 51:C1-203
Publikováno v:
2010 10th IEEE Conference on Nanotechnology (IEEE-NANO); 2010, p394-397, 4p
Publikováno v:
2010 10th IEEE Conference on Nanotechnology (IEEE-NANO); 2010, p308-311, 4p
Publikováno v:
Japanese Journal of Applied Physics. 34:5001
SF6 dry post-etch treatment after contact hole etching has been compared with both NF3 and CF4+O2 post-etch treatment (PET) through measurement of electrical characteristics. It is found that SF6 PET produces the smallest contact resistance at 0.2 µ