Zobrazeno 1 - 10
of 317
pro vyhledávání: '"Kirmse, H."'
Autor:
Jenichen, B, Herfort, J, Hanke, M, Jahn, U, Kong, X, Dau, M T, Trampert, A, Kirmse, H, Erwin, S C
Publikováno v:
J. Appl. Phys. 120, 225304 (2016)
Co$_{2}$TiSi films were grown by molecular beam epitaxy on GaAs(001) and analyzed using reflection high-energy electron diffraction, and electron microscopy. In addition, X-ray diffraction was combined with lattice parameter calculations by density f
Externí odkaz:
http://arxiv.org/abs/1907.05238
Autor:
Jenichen, B, Hanke, M, Gaucher, S, Trampert, A, Herfort, J, Kirmse, H, Haas, B, Willinger, E, Huang, X, Erwin, S C
Publikováno v:
Physical Review Materials 2, 051402(R) (2018)
Fe$_{3}$Si/Ge(Fe,Si)/Fe$_{3}$Si thin film stacks were grown by a combination of molecular beam epitaxy and solid phase epitaxy (Ge on Fe$_{3}$Si). The stacks were analyzed using electron microscopy, electron diffraction, and synchrotron X-ray diffrac
Externí odkaz:
http://arxiv.org/abs/1907.05189
Publikováno v:
In Microelectronic Engineering December 2013 112:198-203
Publikováno v:
In Thin Solid Films 2007 515(15):5925-5928
Autor:
Jenichen, B., Herfort, J., Hanke, M., Jahn, U., Kong, X., Dau, M. T., Trampert, A., Kirmse, H., Erwin, S. C.
Publikováno v:
Journal of Applied Physics; 2016, Vol. 120 Issue 22, p225304-1-225304-6, 6p, 3 Diagrams, 1 Chart, 5 Graphs
Publikováno v:
In IFAC Proceedings Volumes 2006 39(16):578-583
Autor:
Müller-Kirsch, L. *, Ledentsov, N.N., Sellin, R., Pohl, U.W., Bimberg, D., Häusler, I., Kirmse, H., Neumann, W.
Publikováno v:
In Journal of Crystal Growth 2003 248:333-338
Publikováno v:
In Solar Energy Materials and Solar Cells 2001 70(1):39-47
Autor:
Hatami, F. *, Müller, U., Kissel, H., Braune, K., Blum, R.-P., Rogaschewski, S., Niehus, H., Kirmse, H., Neumann, W., Schmidbauer, M., Köhler, R., Masselink, W.T.
Publikováno v:
In Journal of Crystal Growth 15 June 2000 216(1-4):26-32
Publikováno v:
In Ultramicroscopy 2000 81(3):289-300