Zobrazeno 1 - 10
of 26 456
pro vyhledávání: '"Kirkland IS"'
Autor:
Shinde, Rajat, Phillips, Christopher E., Ankur, Kumar, Gupta, Aman, Pfreundschuh, Simon, Roy, Sujit, Kirkland, Sheyenne, Gaur, Vishal, Lin, Amy, Sheshadri, Aditi, Nair, Udaysankar, Maskey, Manil, Ramachandran, Rahul
High-quality machine learning (ML)-ready datasets play a foundational role in developing new artificial intelligence (AI) models or fine-tuning existing models for scientific applications such as weather and climate analysis. Unfortunately, despite t
Externí odkaz:
http://arxiv.org/abs/2412.02780
A centrality measure of the cut-edges of an undirected graph, given in [Altafini et al.~SIMAX 2023] and based on Kemeny's constant, is revisited. A numerically more stable expression is given to compute this measure, and an explicit expression is pro
Externí odkaz:
http://arxiv.org/abs/2411.19603
Autor:
Dimova, N., Barnard, J. S., Bortoletto, D., Crevatin, G., Gallagher-Jones, M., Goldsbrough, R., Hynds, D., Kirkland, A., O'Ryan, L., Plackett, R., Shipsey, I., Weatherill, D., Wood, D.
We have evaluated the imaging capabilities of the Timepix4 hybrid silicon pixel detector for 100 keV and 200 keV electrons in a Transmission Electron Microscope (TEM). Using the knife-edge method, we have measured the Modulation Transfer Function (MT
Externí odkaz:
http://arxiv.org/abs/2411.16258
Autor:
Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Robinson, Alex W., Browning, Nigel D., Kirkland, Angus I.
The extended Ptychographical Iterative Engine (ePIE) is a widely used phase retrieval algorithm for Electron Ptychography from 4-dimensional (4-D) Scanning Transmission Electron Microscopy (4-D STEM) measurements acquired with a focused or defocused
Externí odkaz:
http://arxiv.org/abs/2411.14915
Autor:
Pattison, Alexander J., Ribet, Stephanie M., Noack, Marcus M., Varnavides, Georgios, Park, Kunwoo, Kirkland, Earl, Park, Jungwon, Ophus, Colin, Ercius, Peter
Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning aberrations without
Externí odkaz:
http://arxiv.org/abs/2410.14873
Autor:
Gates, J. M., Orford, R., Rudolph, D., Appleton, C., Barrios, B. M., Benitez, J. Y., Bordeau, M., Botha, W., Campbell, C. M., Chadderton, J., Chemey, A. T., Clark, R. M., Crawford, H. L., Despotopulos, J. D., Dorvaux, O., Esker, N. E., Fallon, P., Folden III, C. M., Gall, B. J. P., Garcia, F. H., Golubev, P., Gooding, J. A., Grebo, M., Gregorich, K. E., Guerrero, M., Henderson, R. A., Herzberg, R. -D., Hrabar, Y., King, T. T., Covo, M. Kireeff, Kirkland, A. S., Krücken, R., Leistenschneider, E., Lykiardopoulou, E. M., McCarthy, M., Mildon, J. A., Müller-Gatermann, C., Phair, L., Pore, J. L., Rice, 1 E., Rykaczewski, K. P., Sammis, B. N., Sarmiento, L. G., Seweryniak, D., Sharp, D. K., Sinjari, A., Steinegger, P., Stoyer, M. A., Szornel, J. M., Thomas, K., Todd, D. S., Vo, P., Watson, V., Wooddy, P. T.
The $^{244}$Pu($^{50}$Ti,$xn$)$^{294-x}$Lv reaction was investigated at Lawrence Berkeley National Laboratory's 88-Inch Cyclotron facility. The experiment was aimed at the production of a superheavy element with $Z\ge 114$ by irradiating an actinide
Externí odkaz:
http://arxiv.org/abs/2407.16079
Autor:
Broad, Zoë, Robinson, Alex W., Wells, Jack, Nicholls, Daniel, Moshtaghpour, Amirafshar, Kirkland, Angus I., Browning, Nigel D.
Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite these advances, issues such as the complexity of sample preparation, re
Externí odkaz:
http://arxiv.org/abs/2407.11724
We consider the state transfer properties of continuous time quantum walks on trees of diameter 4. We characterize all pairs of strongly cospectral vertices in trees of diameter 4, finding that they fall into pairs of three different types. For each
Externí odkaz:
http://arxiv.org/abs/2406.15289
Autor:
Xu, Wenhui, Ning, Shoucong, Sheng, Pengju, Lin, Huixiang, Kirkland, Angus I, Peng, Yong, Zhang, Fucai
Ptychography is now integrated as a tool in mainstream microscopy allowing quantitative and high-resolution imaging capabilities over a wide field of view. However, its ultimate performance is inevitably limited by the available coherent flux when im
Externí odkaz:
http://arxiv.org/abs/2406.06640
Autor:
Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W., Kirkland, Angus I., Browning, Nigel D.
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent reports suggest
Externí odkaz:
http://arxiv.org/abs/2406.02207