Zobrazeno 1 - 10
of 486
pro vyhledávání: '"Kirkland Angus I."'
Autor:
Broad Zoe, Wells Jack, Nicholls Daniel, Robinson Alex W., Moshtaghpour Amirafshar, Masters Robert, Hughes Louise, Kirkland Angus I., Browning Nigel D.
Publikováno v:
BIO Web of Conferences, Vol 129, p 07032 (2024)
Externí odkaz:
https://doaj.org/article/9f304c2765104bce84a359c613cc506e
Autor:
Broad, Zoë, Robinson, Alex W., Wells, Jack, Nicholls, Daniel, Moshtaghpour, Amirafshar, Kirkland, Angus I., Browning, Nigel D.
Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite these advances, issues such as the complexity of sample preparation, re
Externí odkaz:
http://arxiv.org/abs/2407.11724
Autor:
Xu, Wenhui, Ning, Shoucong, Sheng, Pengju, Lin, Huixiang, Kirkland, Angus I, Peng, Yong, Zhang, Fucai
Ptychography is now integrated as a tool in mainstream microscopy allowing quantitative and high-resolution imaging capabilities over a wide field of view. However, its ultimate performance is inevitably limited by the available coherent flux when im
Externí odkaz:
http://arxiv.org/abs/2406.06640
Autor:
Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W., Kirkland, Angus I., Browning, Nigel D.
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent reports suggest
Externí odkaz:
http://arxiv.org/abs/2406.02207
Autor:
Mao, Wei, Zhang, Weiyang, Huang, Chen, Zhou, Liqi, Kim, Judy. S., Gao, Si, Lei, Yu, Wu, Xiaopeng, Hu, Yiming, Pei, Xudong, Fang, Weina, Liu, Xiaoguo, Song, Jingdong, Fan, Chunhai, Nie, Yuefeng, Kirkland, Angus. I., Wang, Peng
Advances in bioimaging methods and hardware facilities have revolutionised the determination of numerous biological structures at atomic or near-atomic resolution. Among these developments, electron ptychography has recently attracted considerable at
Externí odkaz:
http://arxiv.org/abs/2403.16902
Autor:
Weber, Dieter, Landers, David, Huang, Chen, Liberti, Emanuela, Poghosyan, Emiliya, Bryan, Matthew, Clausen, Alexander, Stroppa, Daniel G., Kirkland, Angus I., Müller, Elisabeth, Stewart, Andrew, Dunin-Borkowski, Rafal E.
In four-dimensional scanning transmission electron microscopy (4D STEM) a focused beam is scanned over a specimen and a diffraction pattern is recorded at each position using a pixelated detector. During the experiment, it must be ensured that the sc
Externí odkaz:
http://arxiv.org/abs/2403.08538
Autor:
Robinson, Alex W., Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Chi, Miaofang, MacLaren, Ian, Kirkland, Angus I., Browning, Nigel D.
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed to achieve these results compared to conventional 4-D approaches requir
Externí odkaz:
http://arxiv.org/abs/2309.14055
Autor:
Nicholls, Daniel, Kobylysnka, Maryna, Wells, Jack, Broad, Zoe, Robinson, Alex W., McGrouther, Damien, Moshtaghpour, Amirafshar, Kirkland, Angus I., Fleck, Roland A., Browning, Nigel D.
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with immense data sets being produced. When imaging beam sensitive materials, t
Externí odkaz:
http://arxiv.org/abs/2309.09617
There is a clear need for developments in characterisation techniques that provide detailed information about structure-function relationships in biology. Using electron microscopy to achieve high resolution while maintaining a broad field of view re
Externí odkaz:
http://arxiv.org/abs/2309.04881
Autor:
Nicholls, Daniel, Wells, Jack, Robinson, Alex W., Moshtaghpour, Amirafshar, Kirkland, Angus I., Browning, Nigel D.
Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of the electron probe beam as a function of the history of the scan. Hyst
Externí odkaz:
http://arxiv.org/abs/2307.08441