Zobrazeno 1 - 10
of 832
pro vyhledávání: '"Kirkland, A. I."'
Autor:
Broad, Zoë, Robinson, Alex W., Wells, Jack, Nicholls, Daniel, Moshtaghpour, Amirafshar, Kirkland, Angus I., Browning, Nigel D.
Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite these advances, issues such as the complexity of sample preparation, re
Externí odkaz:
http://arxiv.org/abs/2407.11724
Autor:
Xu, Wenhui, Ning, Shoucong, Sheng, Pengju, Lin, Huixiang, Kirkland, Angus I, Peng, Yong, Zhang, Fucai
Ptychography is now integrated as a tool in mainstream microscopy allowing quantitative and high-resolution imaging capabilities over a wide field of view. However, its ultimate performance is inevitably limited by the available coherent flux when im
Externí odkaz:
http://arxiv.org/abs/2406.06640
Autor:
Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W., Kirkland, Angus I., Browning, Nigel D.
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent reports suggest
Externí odkaz:
http://arxiv.org/abs/2406.02207
Autor:
Mao, Wei, Zhang, Weiyang, Huang, Chen, Zhou, Liqi, Kim, Judy. S., Gao, Si, Lei, Yu, Wu, Xiaopeng, Hu, Yiming, Pei, Xudong, Fang, Weina, Liu, Xiaoguo, Song, Jingdong, Fan, Chunhai, Nie, Yuefeng, Kirkland, Angus. I., Wang, Peng
Advances in bioimaging methods and hardware facilities have revolutionised the determination of numerous biological structures at atomic or near-atomic resolution. Among these developments, electron ptychography has recently attracted considerable at
Externí odkaz:
http://arxiv.org/abs/2403.16902
Autor:
Weber, Dieter, Landers, David, Huang, Chen, Liberti, Emanuela, Poghosyan, Emiliya, Bryan, Matthew, Clausen, Alexander, Stroppa, Daniel G., Kirkland, Angus I., Müller, Elisabeth, Stewart, Andrew, Dunin-Borkowski, Rafal E.
In four-dimensional scanning transmission electron microscopy (4D STEM) a focused beam is scanned over a specimen and a diffraction pattern is recorded at each position using a pixelated detector. During the experiment, it must be ensured that the sc
Externí odkaz:
http://arxiv.org/abs/2403.08538
Autor:
Robinson, Alex W., Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Chi, Miaofang, MacLaren, Ian, Kirkland, Angus I., Browning, Nigel D.
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed to achieve these results compared to conventional 4-D approaches requir
Externí odkaz:
http://arxiv.org/abs/2309.14055
Autor:
Nicholls, Daniel, Kobylysnka, Maryna, Wells, Jack, Broad, Zoe, Robinson, Alex W., McGrouther, Damien, Moshtaghpour, Amirafshar, Kirkland, Angus I., Fleck, Roland A., Browning, Nigel D.
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with immense data sets being produced. When imaging beam sensitive materials, t
Externí odkaz:
http://arxiv.org/abs/2309.09617
There is a clear need for developments in characterisation techniques that provide detailed information about structure-function relationships in biology. Using electron microscopy to achieve high resolution while maintaining a broad field of view re
Externí odkaz:
http://arxiv.org/abs/2309.04881
Autor:
Nicholls, Daniel, Wells, Jack, Robinson, Alex W., Moshtaghpour, Amirafshar, Kirkland, Angus I., Browning, Nigel D.
Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of the electron probe beam as a function of the history of the scan. Hyst
Externí odkaz:
http://arxiv.org/abs/2307.08441
Autor:
Robinson, Alex W., Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Broad, Zoe, Kirkland, Angus I., Mehdi, Beata L., Browning, Nigel D.
High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the properties of complex materials such as battery cathodes; however, multid
Externí odkaz:
http://arxiv.org/abs/2307.06138