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pro vyhledávání: '"Kirill A. Yesenkov"'
Autor:
Valentin O. Turin, R. G. Useinov, Vasily S. Anashin, Gennady I. Zebrev, Kirill A. Yesenkov, Maxim S. Gorbunov, Alexander S. Vatuev, Vladimir V. Emeliyanov
Publikováno v:
IEEE Transactions on Nuclear Science. 61:1531-1536
We study experimentally and theoretically the microdose induced drain-source leakage current in the trench power MOSFETs under irradiation with high-LET heavy ions. We have found experimentally that cumulative increase of leakage drain current occurs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::609c354146fb636118df6c0446f1a2d7
https://doi.org/10.1109/tns.2014.2315852
https://doi.org/10.1109/tns.2014.2315852
