Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Kiril Sakhno"'
Publikováno v:
Proceedings of the International Conference on Applied Innovations in IT, Vol 12, Iss 1, Pp 123-127 (2024)
A novel approach has been introduced to estimate the parameters of exponential and DN distributions during the rejection testing of electronic devices, accompanied by a detailed procedure for its implementation. This innovative method enhances noise
Externí odkaz:
https://doaj.org/article/d412550d5afc490d8650ba230662f360
