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pro vyhledávání: '"Kinameri, Kanji"'
Autor:
Kinameri Kanji
Publikováno v:
JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN. 70:498-501
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7cd46bc572a101e887d8b55cc639342f
https://doi.org/10.2150/jieij1980.70.9_498
https://doi.org/10.2150/jieij1980.70.9_498
Autor:
Kinameri, Kanji, Nonaka, Mamoru
Publikováno v:
Applied Optics; January 1979, Vol. 18 Issue: 1 p135-140, 6p
Publikováno v:
Scanning Microscopy
A technique for imaging the distribution of ac surface photovoltages induced in a semiconductor wafer by the irradiation with a blue or near-infrared chopped photon beam is applied to non-destructive inspection of faults in Si or GaAs wafers. Faults
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1459::c404b18cbd4ac257b8c8980d2ca13485
https://digitalcommons.usu.edu/context/microscopy/article/1518/viewcontent/WDCcenterscan1988KinameriMunakataHonma_ApplicationPhotovoltageImaging.pdf
https://digitalcommons.usu.edu/context/microscopy/article/1518/viewcontent/WDCcenterscan1988KinameriMunakataHonma_ApplicationPhotovoltageImaging.pdf
Publikováno v:
Japanese Journal of Applied Physics; January 1987, Vol. 26 Issue: 2 p226-226, 1p