Zobrazeno 1 - 10
of 162
pro vyhledávání: '"Kin. P. Cheung"'
Autor:
Canute I. Vaz, Changze Liu, Jason P. Campbell, Jason T. Ryan, Richard G. Southwick III, David Gundlach, Anthony S. Oates, Ru Huang, Kin. P. Cheung
Publikováno v:
AIP Advances, Vol 6, Iss 6, Pp 065212-065212-9 (2016)
Wave scattering by a potential step is a ubiquitous concept. Thus, it is surprising that theoretical treatments of ballistic transport in nanoscale devices, from quantum point contacts to ballistic transistors, assume no reflection even when the pote
Externí odkaz:
https://doaj.org/article/3c8469cce313441ba2472d9316506c9b
Autor:
Kin P Cheung
Publikováno v:
Power Electronic Devices and Components, Vol 4, Iss , Pp 100024- (2023)
Power electronics is currently a hot topic due to its important role in fighting climate change. Gate oxide breakdown is the Achilles heel of power devices, and it is well known that extrinsic breakdown is the chief concern. However, the root cause o
Externí odkaz:
https://doaj.org/article/93de964f1126480a9a6bffc52a0db9ba
Autor:
Kin On Cheung, MBBS, FRCR (UK), Tun Hing Lui, MBBS,FRCS(Edin),FHKAM (Orthopaedic Surgery),FHKCOS, Catherine Wing Yan Tam, MBBCh BAO, MSc, Kwok Fai Godfrey Tam, MBChB, FRCR(UK), FHKCR, FHKAM (Radiology)
Publikováno v:
Radiology Case Reports, Vol 16, Iss 12, Pp 3776-3782 (2021)
Pseudoaneurysm of the iliac arteries are rarely reported in the literature. Failure to identify the pathology may delay the necessary treatment, and potentially lead to high mortality. We report a case of ruptured mycotic iliac artery aneurysm in a 4
Externí odkaz:
https://doaj.org/article/d90ea47b803b477ab9348e4ec3f6bda6
Autor:
Lawrence C.M. Lau, Jason C.H. Fan, Kwong-Yin Chung, Kin-Wing Cheung, Gene C.W. Man, Yuk-Wah Hung, Carson K.B. Kwok, Kevin K.W. Ho, Kwok-Hing Chiu, Patrick S.H. Yung
Publikováno v:
Journal of Orthopaedic Translation, Vol 26, Iss , Pp 60-66 (2021)
Background: This prospective cohort study was designed to evaluate the survivorship and functional outcomes associated with long-term results of medial open-wedge high tibial osteotomy (MOWHTO) for the treatment of medial compartment knee osteoarthri
Externí odkaz:
https://doaj.org/article/7f4fa9a976d54bdca37ffcf2cf8c8cfb
Autor:
Moses Man-Lung Li, Jojo Yan-Yan Kwok, Kwong-Yin Chung, Kin-Wing Cheung, Kwok-Hing Chiu, Wai-Wang Chau, Kevin Ki-Wai Ho
Publikováno v:
Knee Surgery & Related Research, Vol 32, Iss 1, Pp 1-6 (2020)
Abstract Background Total knee arthroplasty (TKA) is associated with significant perioperative blood loss and postoperative allogenic blood transfusion. Tranexamic acid (TXA) reversibly blocks lysine binding sites on plasminogen molecules and inhibit
Externí odkaz:
https://doaj.org/article/85eaccc597a84894b264c9335eec7955
Publikováno v:
Journal of Orthopaedics, Trauma and Rehabilitation, Vol 27 (2020)
Isolated femoral condyle fracture is an uncommon entity. It accounts for only 0.65% of all femoral fractures, with lateral condyle involvement three times more frequently than the medial condyle. In neglected cases, nonunion and malalignment may occu
Externí odkaz:
https://doaj.org/article/a836ae322926442f960506d0e18d9221
Autor:
Kin P. Cheung, Barry J. O'Sullivan
Publikováno v:
Applied Physics Letters. 122
This work provides a proof-of-concept demonstration of the room-temperature quantum current source based on a nanoscale metal-oxide-semiconductor-field-effect-transistor (MOSFET). Using a low leakage MOSFET design, the current source achieved 1.000 1
Autor:
Kin P Cheung
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Publikováno v:
Micromachines, Vol 11, Iss 4, p 364 (2020)
Nanoscale metal-oxide-semiconductor field-effect-transistors (MOSFETs) with only one defect at the interface can potentially become a single electron turnstile linking frequency and electronic charge to realize the elusive quantized current source. C
Externí odkaz:
https://doaj.org/article/6bbb07d6458a458092f9ced65de45be4
Autor:
Xiao Lyu, Pragya R. Shrestha, Mengwei Si, Panni Wang, Junkang Li, Kin P. Cheung, Shimeng Yu, Peide D. Ye
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).