Zobrazeno 1 - 10
of 70
pro vyhledávání: '"Kin Choi"'
Autor:
Bing-kin Choi, Ho-nam Chan, Yu-king Wong, Vincent W.C. Wu, Alan W. L. Mui, George Chiu, Ruby Lam
Publikováno v:
Journal of Radiation Oncology. 4:29-35
Volumetric arc therapy (VMAT) and helical tomotherapy (HT) are currently the two state-of-the-art rotational intensity-modulated radiotherapy (IMRT). When compared with conventional IMRT, linac-based VMAT can shorten the treatment time while HT has b
Autor:
Yee Kin Choi, Elsa, Carvou, Erwann, Bourda, Christine, Ben Jemaa, Noureddine, Mitchell, James
Publikováno v:
CAE XII Colloque sur les Arcs Electriques
CAE XII Colloque sur les Arcs Electriques, Mar 2015, Clermont ferrand, France
Journal International de Technologie, de l'Innovation, de la Physique, de l'Energie et de l'Environnement
Journal International de Technologie, de l'Innovation, de la Physique, de l'Energie et de l'Environnement, 2015, 1 (1), ⟨10.18145/jitipee.v1i1.67.g53⟩
Journal International de Technologie, de l'Innovation, de la Physique, de l'Energie et de l'Environnement, Université Clermont Auvergne, 2015, 1 (1), ⟨10.18145/jitipee.v1i1.67.g53⟩
CAE XII Colloque sur les Arcs Electriques, Mar 2015, Clermont ferrand, France
Journal International de Technologie, de l'Innovation, de la Physique, de l'Energie et de l'Environnement
Journal International de Technologie, de l'Innovation, de la Physique, de l'Energie et de l'Environnement, 2015, 1 (1), ⟨10.18145/jitipee.v1i1.67.g53⟩
Journal International de Technologie, de l'Innovation, de la Physique, de l'Energie et de l'Environnement, Université Clermont Auvergne, 2015, 1 (1), ⟨10.18145/jitipee.v1i1.67.g53⟩
Dans les contacts électriques, de type relais, l’augmentation de la résistance de contact peut provenir d’une dégradation de l’interface de contact causée par des arcs électriques. Si ces dégradations sont importantes, elles peuvent cause
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6b51d898c9112a0d5ca8978f87e785d9
https://hal.archives-ouvertes.fr/hal-01133745
https://hal.archives-ouvertes.fr/hal-01133745
Autor:
kin, CHOI Kak
Publikováno v:
Bulletin de Sinologie, 1991 Feb 01(76), 8-9.
Externí odkaz:
https://www.jstor.org/stable/24072707
Autor:
Kin, CHOI Hak
Publikováno v:
Bulletin de Sinologie, 1990 Jun 01(68), 14-16.
Externí odkaz:
https://www.jstor.org/stable/24069487
Autor:
Kin, CHOI Hak
Publikováno v:
Bulletin de Sinologie, 1990 Feb 01(64), 21-21.
Externí odkaz:
https://www.jstor.org/stable/24072887
Autor:
Kin, CHOI Hak
Publikováno v:
Bulletin de Sinologie, 1990 Jan 01(63), 15-21.
Externí odkaz:
https://www.jstor.org/stable/24072936
Autor:
Yee Kin Choi, Elsa, Carvou, Erwann, Bourda, Christine, Vassa, Alexandre, Ben Jemaa, Noureddine, Mitchell, James
Publikováno v:
the 27th International Conference on Electrical Contacts
the 27th International Conference on Electrical Contacts, Jun 2014, Dresden, Germany
the 27th International Conference on Electrical Contacts, Jun 2014, Dresden, Germany
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9922bb79a23e3069f4a5107dfab6d048
https://hal.archives-ouvertes.fr/hal-01117736
https://hal.archives-ouvertes.fr/hal-01117736
Autor:
Deborah G. Maddocks, M. Alberry, G. Attilakos, Kin Choi, Neil D. Avent, Tracey E. Madgett, Peter W. Soothill
Publikováno v:
Biochemical Society Transactions. 37:460-465
After the revolutionary detection of ffDNA (free fetal DNA) in maternal circulation by real-time PCR in 1997 and advances in molecular techniques, NIPD (non-invasive prenatal diagnosis) is now a clinical reality. Non-invasive diagnosis using ffDNA ha
Autor:
R. El Abdi, T. Rodari, N. Benjemaa, Erwann Carvou, E. Yee Kin Choi, L. Doublet, S. El Mossouess
Publikováno v:
61th IEEE Holm Conference on Electrical Contacts
61th IEEE Holm Conference on Electrical Contacts, Oct 2015, San-Diego, United States. pp.304-308
Proceedings of the 2015 Sixty-First IEEE Holm Conference on Electrical Contacts (holm), San Diego
Proceedings of the 2015 Sixty-First IEEE Holm Conference on Electrical Contacts (holm), San Diego, IEEE, pp.304--308, 2015, 978-1-4673-9341-6
61th IEEE Holm Conference on Electrical Contacts, Oct 2015, San-Diego, United States. pp.304-308
Proceedings of the 2015 Sixty-First IEEE Holm Conference on Electrical Contacts (holm), San Diego
Proceedings of the 2015 Sixty-First IEEE Holm Conference on Electrical Contacts (holm), San Diego, IEEE, pp.304--308, 2015, 978-1-4673-9341-6
In a previous work we observe that the vibration of contact interfaces is the main cause of contact voltage fluctuations due to the so called fretting corrosion phenomenon. In fact the process of generated particles by mechanical wear produce the inc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a77294455f873ecc1ea3a4bc59ce20e4
https://univ-rennes.hal.science/hal-02385209
https://univ-rennes.hal.science/hal-02385209