Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Kiichi Meguro"'
Publikováno v:
Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21. :273-276
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::893fd05b2f665c47d7a4d84fb26d72cd
https://doi.org/10.1299/jsmelem.2013.7.273
https://doi.org/10.1299/jsmelem.2013.7.273
Autor:
Yoshiyuki Yamamoto, S. Kawamura, Kiichi Meguro, Koichi Sato, Junichi Kaneko, Y. Oshiki, A. Homma, Fumiyuki Fujita, Michihiro Furusaka, Hideyuki Watanabe, T. Imai, K. Tsuji
Publikováno v:
Diamond and Related Materials. 17:833-837
Charge carrier dynamics in CVD homoepitaxial diamond thin films were evaluated. Thicknesses of these thin diamond films were 4.5–14 μm. Measurement was carried out using a fast TOF system with time resolution of 150 ps. This system adopted the loc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f7ca52ed5e1da5b70844f9ed7f229c8
https://doi.org/10.1016/j.diamond.2007.12.056
https://doi.org/10.1016/j.diamond.2007.12.056
Autor:
Y. Yamamoto, Junichi Kaneko, Takahiro Imai, Teruko Sawamura, Michihiro Furusaka, S. Kawamura, Kiichi Meguro, Koji Kobashi, Y. Oshiki, A. Homma, Kazushi Hayashi, Yoshihiro Yokota, Fumiyuki Fujita
Publikováno v:
Diamond and Related Materials. 15:1508-1512
Drift velocities of charge carriers in polycrystalline diamonds were measured by a self-triggered time-of-flight (TOF) method with alpha particles based on a radiation measurement technique. Based on these measured results, a synthesis method for pol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c031c09b58be185efde6ccfac77e2a05
https://doi.org/10.1016/j.diamond.2005.12.002
https://doi.org/10.1016/j.diamond.2005.12.002
Autor:
Kiichi Meguro, Y. Oshiki, S. Kawamura, Junichi Kaneko, Y. Yamamoto, Fumiyuki Fujita, Tokuyuki Teraji, Michihiro Furusaka, Takahiro Imai, A. Homma, K. Tsuji, Hideyuki Watanabe
Publikováno v:
Diamond and Related Materials. 15(11-12):1921-1925
A fast TOF measurement system with 150 ps time resolution for transport behavior of free charge carriers in an intrinsic diamond film by using a UV pulsed laser was developed. The 213 nm UV laser light narrowed to approximately 80 μm widths could lo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::717a3a09f800e20962b7fde7d0846c0a
http://hdl.handle.net/2115/17257
http://hdl.handle.net/2115/17257
Autor:
Hironori Nakahara, Naoshi Sakuma, Hiroshi Imai, Yoshihiro Yokota, Kenjiro Oura, Hiroaki Yoshida, Yasuhito Gotoh, Inoue Kenichi, Robert J. Nemanich, Nobuyuki Kawakami, Yutaka Ando, Takashi Hirao, Hiroshi Tsuji, Koji Kobashi, F.A.M. Koeck, Kazushi Hayashi, Takeshi Tachibana, Hiroshi Furuta, Yoshiki Nishibayashi, Kiichi Meguro, Junzo Ishikawa, Tadashi Sakai
Publikováno v:
Diamond and Related Materials. 12:233-240
R&D activities on diamond chemical vapor deposition (CVD) and field emission in the Frontier Carbon Technology Project are presented. The topics are (1) morphology control of diamond films grown by a 60-kW, 915-MHz microwave plasma CVD reactor, (2) g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3716f56e44eb0bc87fbc609c1eeaf933
https://doi.org/10.1016/s0925-9635(02)00298-4
https://doi.org/10.1016/s0925-9635(02)00298-4
Autor:
Junichi Kaneko, Kiichi Meguro, Tokuyuki Teraji, Fumiyuki Fujita, Y. Oshiki, Takahiro Imai, A. Homma, Y. Yamamoto, Teruko Sawamura, K. Tsuji, Michihiro Furusaka
Publikováno v:
Diamond and Related Materials. 14(11-12):1992-1994
There are continuing efforts of developing faster FETs and diamond is one of the strong candidates as a base semiconductor. Since the upper-limit-frequency of diamond FETs determines saturated drift velocities of charge-carriers, we need to first cha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a3f2fba956cb0ff99fe53df3ea4ab240
http://hdl.handle.net/2115/8291
http://hdl.handle.net/2115/8291
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::781f53d47142481db86f35c59eac4a9e
https://doi.org/10.4271/2013-01-2227
https://doi.org/10.4271/2013-01-2227