Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Ki‐Chun Lee"'
Autor:
Tae-Kook Park, Mu-Seong Chang, Keun-Hui Lee, Choi Young-Do, Ki-Chun Lee, Jae-Hyoung Kim, Dae-Hwan Kim
Publikováno v:
New & Renewable Energy. 15:42-51
Publikováno v:
Journal of Applied Reliability. 19:1-12
Purpose: In this study, the dynamic performance by the reproduced water hammer was compared and analyzed according to the shape of the check valve. Methods: The pressure variation caused by water hammer can be obtained using the Joukowsky equation. I
Autor:
Han-Ill Yoo, Ki-Chun Lee
Publikováno v:
Journal of Physics and Chemistry of Solids. 60:911-927
Hebb–Wagner-type polarization and relaxation processes are theoretically analyzed in the presence of the cross effect between ionic and electronic flows in a mixed ionic/electronic conductor A 1− δ X. Analytic, transient solutions have been foun
Autor:
Ki‐Chun Lee, Hem‐Ill Yoo
Publikováno v:
Journal of The Electrochemical Society. 145:4243-4247
Microstructural changes have been examined in a polycrystalline, semiconducting oxide, e.g., CoO, under dc electric fields in an air-electrode condition. A change always starts at a singularity such as an interface or phase boundary where the diverge
Autor:
Ki-Chun Lee, Han-Ill Yoo
Publikováno v:
Zeitschrift für Physikalische Chemie. 207:127-146
Autor:
Han-Ill Yoo, Ki-Chun Lee
Publikováno v:
Solid State Ionics. 92:25-36
The ionic transference number of semiconducting Co1 − δO has been measured as a function of oxygen activity in the entire stability range of the phase at 1000, 1100, 1200 and 1300 °C, respectively, via a modified Tubandt-like electrotransport tec
Autor:
Ki-Chun Lee, Han-Ill Yoo
Publikováno v:
Solid State Ionics. :757-760
A new experiment has been designed on the basis of the polarization in an ion-blocking electrode condition, which allows one to simultaneously determine the ionic charge-of-transport ( α 1 ∗ ) and chemical diffusivity ( D ) of a mixed conductor co
Autor:
Dave M. Flanaghan, John Ferro, Young Bum Kum, Sae Hoon Kim, Tae Won Lim, Ki Chun Lee, Joon Chul Park
Publikováno v:
SAE Technical Paper Series.
Publikováno v:
SAE Technical Paper Series.