Zobrazeno 1 - 10
of 40
pro vyhledávání: '"Khursheed, Syed"'
Publikováno v:
Rajagiri Management Journal, 2023, Vol. 18, Issue 2, pp. 125-136.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/RAMJ-09-2022-0147
Publikováno v:
LBS Journal of Management & Research, 2023, Vol. 21, Issue 1, pp. 13-29.
Autor:
Khursheed, Syed Saqib
A key design constraint of circuits used in hand-held devices is the power consumption, mainly due to battery life limitations. Adaptive power management (APM) techniques aim to increase the battery life by adjusting the supply voltage (Vdd) and oper
Externí odkaz:
https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.515876
Autor:
GANAI, WASEEM UD DIN, FAROOQ, SYED SURAIYA, NABI, MUDASAR, TANTRY, BILAL AHMAD, BANDY, ALTAF, KHURSHEED, SYED QUIBTIYA, DAR, NAEEM FIRDOUS, RASOOL, SHAYAQ UL ABEER, ALOTAIBI, BADER S., SHAH, NAVEED NAZIR
Publikováno v:
World Academy of Sciences Journal; Sep/Oct2024, Vol. 6 Issue 5, p1-8, 8p
Autor:
Aman, Munaza, Mir, Anjum Ara, Bashir, Gulnaz, Wani, Sayim, Khursheed, Syed, Ahangar, Irfan Nisar
Publikováno v:
International Journal of Mycobacteriology; Apr-Jun2024, Vol. 13 Issue 2, p191-196, 6p
Autor:
Alfares *, Hesham K. (AUTHOR), Khursheed, Syed Naveed (AUTHOR), Noman, Syed Mobasher (AUTHOR)
Publikováno v:
International Journal of Production Research. 3/1/2005, Vol. 43 Issue 5, p899-911. 13p. 3 Charts.
Autor:
Alotaibi, Bader S., Tantry, Bilal Ahmad, Bandy, Altaf, Ahmad, Reyaz, Khursheed, Syed Quibtiya, Ahmad, Arshid, Hakami, Mohammed Ageeli, Shah, Naveed Nazir
Publikováno v:
Tropical Medicine & Infectious Disease; Jun2023, Vol. 8 Issue 6, p326, 10p
Background: Dactylography/Dactyloscopy/Dermatoglyphics is the study of fingerprints as a method of identification.Fingerprint is an easily available,accurate and authentic method of identification.Importance of fingerprints is of immense use in foren
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0338d35b6ea892d2c927bc4f64b0fd6a
Publikováno v:
34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=core_ac_uk__::a8a4ec114c634e62904aabfba134e5d5
http://livrepository.liverpool.ac.uk/3134180/1/DFT_2021_STL_OPTIMISATION_PAPER.pdf
http://livrepository.liverpool.ac.uk/3134180/1/DFT_2021_STL_OPTIMISATION_PAPER.pdf
Publikováno v:
IEEE Transactions on Very Large Scale Integration Systems
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=core_ac_uk__::e94659527d970c98c441f612a6020583