Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Khim Hong Ng"'
Evaluation of Truly Passive Crossbar Memory Arrays on Short Flow Characterization Vehicle Test Chips
Autor:
Christoph Dolainsky, Dennis Ciplickas, Tomasz Brozek, Rakesh Vallishayee, Christopher Hess, Khim Hong Ng, Hendrik Schneider, Meindert Lunenborg, Larg Weiland, Yuan Yu
Publikováno v:
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS).
More and more non volatile memory bit cell candidates are emerging which can be implemented between two metal layers in the BEOL process. Thus, short flow Characterization Vehicle® (CV®) Test Chips become beneficial for fast yield and endurance lea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5780c8c3dbd4aa82f1c59edf5c890228
https://doi.org/10.1109/icmts.2019.8730984
https://doi.org/10.1109/icmts.2019.8730984
