Zobrazeno 1 - 10
of 282
pro vyhledávání: '"Khatir Z"'
Publikováno v:
In Microelectronics Reliability August 2023 147
Publikováno v:
In Microelectronics Reliability November 2022 138
Publikováno v:
In Microelectronics Reliability May 2022 132
Autor:
Hamad, Hazim S., Kapur, N., Khatir, Z., Querin, O.M., Thompson, H.M., Wang, Yongxing, Wilson, M.C.T.
Publikováno v:
In Applied Thermal Engineering 25 January 2021 183 Part 1
Publikováno v:
In Microelectronics Reliability November 2020 114
Publikováno v:
In Microelectronics Reliability November 2020 114
Publikováno v:
In Microelectronics Reliability November 2020 114
Wire-bond contact degradation modeling for remaining useful lifetime prognosis of IGBT power modules
Publikováno v:
In Microelectronics Reliability November 2020 114
Publikováno v:
In Microelectronics Reliability February 2020 105
Publikováno v:
In Microelectronics Reliability September 2018 88-90:671-676