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Autor:
Khatchaturiants, Artem, Mucientes, Marta, Kalinin, Arseniy, Guo, Yan, Kim, Seokhan, Moussa, Alain, Bogdanowicz, Janusz, Severi, Joren, Lorusso, Gian F., De Simone, Danilo, Charley, Anne-Laure, Leray, Philippe, van Reijzen, Maarten E., Bozdog, Cornel, Sadeghian, Hamed M.
Publikováno v:
Metrology, Inspection, and Process Control XXXVI
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17d04b7f17b85e7710b32ad944974416
https://doi.org/10.1117/12.2616089
https://doi.org/10.1117/12.2616089
