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pro vyhledávání: '"Khaled M. Soradi"'
Autor:
Khaled M. Soradi, Nevin M. Darwish
Publikováno v:
Journal of Electrical Systems and Information Technology, Vol 3, Iss 2, Pp 210-216 (2016)
Double patterning photolithography (DPL) is considered one of the best solutions used for enabling 32 nm/22 nm technology. In this paper, we propose a new technique for double patterning post decomposition conflict resolution. The algorithm is based
Externí odkaz:
https://doaj.org/article/938ff82c76fb41e1b4af9d6fa52d7518
Autor:
Nevin M. Darwish, Khaled M. Soradi
Publikováno v:
Journal of Electrical Systems and Information Technology, Vol 3, Iss 2, Pp 210-216 (2016)
Double patterning photolithography (DPL) is considered one of the best solutions used for enabling 32 nm/22 nm technology. In this paper, we propose a new technique for double patterning post decomposition conflict resolution. The algorithm is based