Statistical spread on the displacement damage degradation of irradiated semiconductors

Autor: Alexandre Durand, T. Nuns, Christophe Inguimbert, Kevin Lemiere

Publikováno v: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2021, 490, pp.7-17. ⟨10.1016/j.nimb.2021.01.002⟩

International audience; Non Ionizing Energy Loss (NIEL) is the metric conventionally used to scale displacement damage degradation of irradiated semiconductor materials. Degradation of many electrical parameters is scaled according to this average pa

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https://hal.archives-ouvertes.fr/hal-03330948/document