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pro vyhledávání: '"Kevin Ackman"'
Autor:
Nigel Yarlett, Mary Morada, Deborah A Schaefer, Kevin Ackman, Elizabeth Carranza, Rodrigo de Paula Baptista, Michael W Riggs, Jessica C Kissinger
Publikováno v:
PLoS Pathogens, Vol 20, Iss 2, p e1011992 (2024)
Recent advances in the in vitro cultivation of Cryptosporidium parvum using hollow fiber bioreactor technology (HFB) have permitted continuous growth of parasites that complete all life cycle stages. The method provides access to all stages of the pa
Externí odkaz:
https://doaj.org/article/0e2fb4f6db3040a782fc7aca4017fc3f
Autor:
Kelli L. VanDussen, Lisa J. Funkhouser-Jones, Marianna E. Akey, Deborah A. Schaefer, Kevin Ackman, Michael W. Riggs, Thaddeus S. Stappenbeck, L. David Sibley
Publikováno v:
mBio, Vol 11, Iss 6 (2020)
ABSTRACT The protozoan parasite Cryptosporidium sp. is a leading cause of diarrheal disease in those with compromised or underdeveloped immune systems, particularly infants and toddlers in resource-poor localities. As an enteric pathogen, Cryptospori
Externí odkaz:
https://doaj.org/article/15ba3df73dfa42048c217995bef69455
Autor:
Michael W. Riggs, Marianna E. Akey, Thaddeus S. Stappenbeck, Kevin Ackman, Deborah A. Schaefer, Kelli L. VanDussen, Lisa J. Funkhouser-Jones, L. David Sibley
Publikováno v:
mBio, Vol 11, Iss 6 (2020)
mBio
mBio
Cryptosporidium sp. occupies a unique intracellular niche that exposes the parasite to both host cell contents and the intestinal lumen, including metabolites from the diet and produced by the microbiota. Both dietary and microbial products change ov
Autor:
Kevin Ackman, Marianna E. Akey, Lisa J. Funkhouser-Jones, Michael W. Riggs, L. David Sibley, Kelli L. VanDussen, Thaddeus S. Stappenbeck, Deborah A. Schaefer
The protozoan parasite Cryptosporidium is a leading cause of diarrheal disease in those with compromised or under-developed immune systems, particularly infants and toddlers in resource-poor localities. As an enteric pathogen, Cryptosporidium invades
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c009226d30a1b8c70f3098f275d2e48
https://doi.org/10.1101/2020.09.11.294462
https://doi.org/10.1101/2020.09.11.294462
Publikováno v:
SAE Technical Paper Series.
Periodical
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