Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Kethilen Y. Ouchi"'
Autor:
Mateus O. Da Silva, Caio F.S. Cruz, Agemilson P. Silva, Ruan J.S. Belem, Lucas G.C. Evangelista, Waldir S. S. Junior, Luiz C. S. Garcia Junior, Thiago Brito Bezerra, Edma V.C. Urtiga Mattos, David Alan de Oliveira Ferreira, Ricardo G. Paula, Gustavo M. Torres, Kethilen Y. Ouchi, Wilson C. C. Junior, Andre S. Costa, Adriana S. Souza, Antonio M.C. Pereira, Myke D. M. Valadao, Celso B. Carvalho, Victor L. G. Cavalcante
Publikováno v:
ICCE
Mura on LCD displays are challenging visual defects to detect, due to uneven brightness of the panel. So, automatic detection of mura defects on TVs and monitors is an important application to ensure the quality of LCDs manufactured in electronic pro
Autor:
Luciana R. Costa, Caio F.S. Cruz, Celso B. Carvalho, Mateus O. Da Silva, Ruan J.S. Belem, Agemilson P. Silva, Edma V.C. Urtiga Mattos, Wilson C. C. Junior, Antonio M.C. Pereira, Ricardo G. Paula, Waldir S. S. Junior, Victor L. G. Cavalcante, Anderson S. Jesus, Kethilen Y. Ouchi, Thiago Brito Bezerra, David Alan de Oliveira Ferreira, Gustavo M. Torres
Publikováno v:
ICCE
Bright pixel defect occurs in LCDs when a transistor of a subpixel remains bright. Bright pixels reduce the quality of manufactured devices, negatively impacting companies looking to meet an increasingly demanding market. In this wokr, conducted by t
Autor:
Osmar R.A. Silva, Celso B. Carvalho, Kethilen Y. Ouchi, Mateus O. Da Silva, Andre S. Costa, Adriana S. Souza, Antonio M.C. Pereira, Caio F.S. Cruz, Thiago Brito Bezerra, Anderson S. Jesus, Ruan J.S. Belem, Waldir S. S. Junior, Diego A. Amoedo, Luciana R. Costa, Lucas G.C. Evangelista, David Alan de Oliveira Ferreira, Myke D. M. Valadao, Gustavo M. Torres, Agemilson P. Silva
Publikováno v:
ICCE-TW
Manufacturing TVs and monitors requires an effective method to detect the dead pixels. These defects are usually identified by operators manually. However, manual inspection is susceptible to failure due to human fatigue and generate a high cost for