Zobrazeno 1 - 10
of 36
pro vyhledávání: '"Kervin, John"'
Publikováno v:
Journal of Organizational Behavior, 1998 May 01. 19(3), 305-320.
Externí odkaz:
https://www.jstor.org/stable/3100174
Autor:
Kervin, John B.
Publikováno v:
Sociometry, 1974 Sep 01. 37(3), 349-362.
Externí odkaz:
https://www.jstor.org/stable/2786387
Publikováno v:
Journal of Labor Economics, 1986 Apr 01. 4(2), 257-276.
Externí odkaz:
https://www.jstor.org/stable/2534822
Autor:
Gunderson, Morley, Kervin, John
Publikováno v:
Canadian Journal of Economics. Nov89, Vol. 22 Issue 4, p779. 16p.
Autor:
Kervin, John
Publikováno v:
The Canadian Journal of Sociology / Cahiers canadiens de sociologie, 2003 Jan 01. 28(1), 113-115.
Externí odkaz:
https://www.jstor.org/stable/3341883
Autor:
John Cris F. Jardin, Rico Jossel M. Maestro, Kervin John C. Jocson, Adelson N. Chua, Bernard Raymond D. Pelayo, Ken Bryan F. Fabay, Wes Vernon V. Lofamia, John Richard E. Hizon, Louis P. Alarcon, Joy Alinda R. Madamba, Mark Earvin V. Alba
Publikováno v:
2015 International Workshop on CMOS Variability (VARI).
The delay dependency of digital circuits on process, voltage and temperature variations are usually compensated by using safety margins that set the limit of operating supply voltage or clock frequency. Razor enables the processor to operate beyond t
Autor:
John Cris F. Jardin, Bernard Raymond D. Pelayo, Kervin John C. Jocson, Anastacia B. Alvarez, Ken Bryan F. Fabay, Joy Alinda R. Madamba, Louis P. Alarcon
Publikováno v:
TENCON 2012 IEEE Region 10 Conference.
This paper presents an FPGA implementation of a test port for interfacing and debugging ARM9 processors. The system included a communication interface for debugging the processor, together with the JTAG-based module that granted debugging capability
Autor:
Kervin, John
Publikováno v:
Relations Industrielles / Industrial Relations, 2000 Jul 01. 55(3), 539-540.
Externí odkaz:
https://www.jstor.org/stable/23077453
Autor:
Kervin, John
Publikováno v:
Relations Industrielles / Industrial Relations, 1996 Oct 01. 51(3), 593-594.
Externí odkaz:
https://www.jstor.org/stable/23074297
Autor:
Chua, Adelson N., Maestro, Rico Jossel M., Alba, Mark Earvin V., Lofamia, Wes Vernon V., Pelayo, Bernard Raymond D., Fabay, Ken Bryan F., Jardin, John Cris F., Jocson, Kervin John C. ., Madamba, Joy Alinda R., Hizon, John Richard E., Alarcon, Louis P.
Publikováno v:
2015 International Workshop on CMOS Variability (VARI); 2015, p5-8, 4p