Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Kentaro Nishikata"'
Autor:
Takahiro Namazu, Shozo Inoue, Naoaki Yamashita, Yoshiharu Goshima, Nobutaka Goami, Nobuyuki Naka, Kentaro Nishikata, Shingo Kammachi, Shigeru Kakinuma
Publikováno v:
Materials, Vol 13, Iss 4490, p 4490 (2020)
Materials
Volume 13
Issue 20
Materials
Volume 13
Issue 20
We describe the stress analysis of silicon oxide (SiO2) thin film using cathodoluminescence (CL) spectroscopy and discuss its availability in this paper. To directly measure the CL spectra of the film under uniaxial tensile stresses, specially develo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fcde9291e486aab345b32f2337df3709
https://www.mdpi.com/1996-1944/13/20/4490
https://www.mdpi.com/1996-1944/13/20/4490
Autor:
Shigeru Kakinuma, Nobuyuki Naka, Kentaro Nishikata, Naoaki Yamashita, Shozo Inoue, Takahiro Namazu, Koichi Matsumoto
Publikováno v:
Journal of Nanoscience and Nanotechnology. 11:2861-2866
In this paper, in-situ cathodoluminescence (CL) stress analysis of a silicon oxide (SiO(x)) thin film prepared by wet thermal oxidation is described. The specially-developed uniaxial tensile loading jig was used to apply tensile displacement to the S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b44deb9242f65884052287c7282340e
https://doi.org/10.1166/jnn.2011.3902
https://doi.org/10.1166/jnn.2011.3902
Autor:
Shozo Inoue, Shigeru Kakinuma, Naoaki Yamashita, Nobuyuki Naka, Kentaro Nishikata, Takahiro Namazu, Yoshiharu Goshima
Publikováno v:
The Proceedings of Mechanical Engineering Congress, Japan. 2018:J2230106
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a4a3a36ab59c213cfd799b0347fc6f2
https://doi.org/10.1299/jsmemecj.2018.j2230106
https://doi.org/10.1299/jsmemecj.2018.j2230106
Autor:
Takahiro Namazu, Naoaki Yamashita, Shozo Inoue, Satoshi Ichikawa, Nobutaka Goami, Keisuke Yoshiki, Shigeru Kakinuma, Nobuyuki Naka, Kentaro Nishikata
Publikováno v:
2012 IEEE 25th International Conference on Micro Electro Mechanical Systems (MEMS).
In this article, a technique for non-destructive stress analysis of thermal silicon-oxide (SiO x ) film using cathodoluminescence (CL) spectroscopy is described. The uniaxial tensile tester which can be used in a scanning electron microscope (SEM) ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69e576a8f11f810fa451f29d7af6fcba
https://doi.org/10.1109/memsys.2012.6170165
https://doi.org/10.1109/memsys.2012.6170165
Autor:
Takahiro, Namazu, Naoaki, Yamashita, Shigeru, Kakinuma, Kentaro, Nishikata, Nobuyuki, Naka, Koichi, Matsumoto, Shozo, Inoue
Publikováno v:
Journal of nanoscience and nanotechnology. 11(4)
In this paper, in-situ cathodoluminescence (CL) stress analysis of a silicon oxide (SiO(x)) thin film prepared by wet thermal oxidation is described. The specially-developed uniaxial tensile loading jig was used to apply tensile displacement to the S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::1dac4428920b39046494864b2a72bbb4
https://pubmed.ncbi.nlm.nih.gov/21776644
https://pubmed.ncbi.nlm.nih.gov/21776644
Autor:
Nobutaka Goami, Shozo Inoue, Nobuyuki Naka, Nozomu Araki, Kentaro Nishikata, Takahiro Namazu, Naoaki Yamashita, Shigeru Kakinuma, K. Matsumoto
Publikováno v:
Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc120584e06fc1364ad09659a84c4981
https://doi.org/10.7567/ssdm.2009.p-2-9
https://doi.org/10.7567/ssdm.2009.p-2-9
Autor:
Shozo Inoue, Takahiro Namazu, Shinsuke Kashiwagi, Shigeru Kakinuma, Naoaki Yamashita, Nobuyuki Naka, K. Matsumoto, Kentaro Nishikata
Publikováno v:
Extended Abstracts of the 2008 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6ffc9a0613ca4743eeb415c33561926
https://doi.org/10.7567/ssdm.2008.p-2-3
https://doi.org/10.7567/ssdm.2008.p-2-3
Publikováno v:
Microscopy and Microanalysis. 12:1508-1509
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f73119d4d624c090fbc8b486e95e95e
https://doi.org/10.1017/s1431927606061976
https://doi.org/10.1017/s1431927606061976
Autor:
Nobuyuki Naka, Shigeru Kakinuma, Takahiro Namazu, Satoshi Ichikawa, Kentaro Nishikata, Nobutaka Goami, Naoaki Yamashita, Keisuke Yoshiki, Shozo Inoue
Publikováno v:
The Proceedings of the Materials and Mechanics Conference. 2012:OS1908-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f042ff97e80214af72a0897b8b1da1e
https://doi.org/10.1299/jsmemm.2012._os1908-1_
https://doi.org/10.1299/jsmemm.2012._os1908-1_
Publikováno v:
Chemical Communications. :6563
At the aperture of an optical fiber coupled with a SNOM SERRS-active Ag nanoparticles were selectively fabricated in a mixture of AgNO(3) and sodium citrate aqueous solution by photo-reduction due to an evanescent field.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e20e7df2bdf62e2c56c712bfa1844b4d
https://doi.org/10.1039/b909603e
https://doi.org/10.1039/b909603e