Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Kent J. Howard"'
Autor:
J. C. Wolfe, Fang Chen, Sakhrat Khizroev, T. Ambrose, Dmitri Litvinov, Erik B. Svedberg, Kent J. Howard, Tuviah E. Schlesinger
Publikováno v:
Journal of Magnetism and Magnetic Materials. 283:128-132
This work presents a study of Ga+ ion implantation of polycrystalline hcp cobalt thin films and nanostructures. It is shown that Ga+ ion implantation leads to a substantial modification of magnetic properties including large coercivity increase and s
Autor:
Bharat B. Pant, David E. Laughlin, Martin C. Bonsager, Anup G. Roy, Erik B. Svedberg, Kent J. Howard
Publikováno v:
Journal of Applied Physics. 94:1001-1006
Spin-valve structures might be exposed to higher temperatures in future disk drive applications and might thus degrade faster than it does today if proper materials and methods are not used. In order to determine whether this degradation is due to in
Autor:
Anup G. Roy, Martin C. Bonsager, Erik B. Svedberg, Kent J. Howard, David E. Laughlin, Bharat B. Pant
Publikováno v:
Journal of Applied Physics. 94:993-1000
Signal degradation in spin-valve structures is today a concern for long-term stability of data storage devices. One of the possible degradation mechanisms of spin-valve structures in disk drive applications could be thermally activated diffusion betw
Publikováno v:
Journal of Applied Physics. 93:5519-5526
Deposition of films with controlled gradients across the wafer in terms of both composition and thickness were used together with statistical experimental design methodologies to explore large parameter spaces relevant to the optimization of perpendi
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 20:1341-1346
A set of seed and underlayers for thin film perpendicular recording media has been optimized using a technique involving simultaneous thickness and composition gradients on a single test wafer. Magnetron sputtering under ultrahigh vacuum conditions i
Autor:
C.L. Platt, K.W. Wierman, J. Yu, R.J.M. van de Veerdonk, W.R. Eppler, Kent J. Howard, Erik B. Svedberg
Publikováno v:
IEEE Transactions on Magnetics. 37:3956-3959
The characteristics of exchange-biased soft underlayers (SULs) were investigated using magnetic force microscopy and spin stand measurements with a single-pole (focused ion-beam trimmed gap) writer and magnetoresistive head. The SUL high-moment mater
Autor:
Shingo Tamaru, Kent J. Howard, James A. Bain, R.J.M. van de Veerdonk, Mark H. Kryder, Ganping Ju, J. Wolfson, Dieter Weller, Erik B. Svedberg, K.W. Wierman
Publikováno v:
IEEE Transactions on Magnetics. 37:1570-1572
Measurements are presented of sub-nanosecond magnetization reversal processes of perpendicularly magnetized (CoCr/Pt) multilayers using real-time Kerr microscopy. The multilayers are placed on a ring-type recording head which is used as a sub-ns rise
Autor:
Dmitri Litvinov, Anup G. Roy, Sakhrat Khizroev, David E. Laughlin, Timothy J. Klemmer, Kent J. Howard
Publikováno v:
Journal of Applied Physics. 89:7531-7533
We have investigated Co/Pd multilayers deposited on either Ta or indium tin oxide (ITO) seed layers as a potential perpendicular recording media. We have examined the microstructural evolution of the films deposited on the two different types of seed
Autor:
Kent J. Howard, Bin Lu, K. W. Wierman, Timothy J. Klemmer, David E. Laughlin, G. Ju, Anup G. Roy
Publikováno v:
Journal of Applied Physics. 91:8031
The effects of the RuxCr1−x/Ta underlayer on the microstructural and magnetic properties of CoCrPtB perpendicular films were investigated. The hcp RuxCr1−x (0002) texture was observed to grow perpendicular to the film plane with narrow rocking cu
Autor:
S. Mukherjee, James A. Bain, R. Carley, Sakhrat Khizroev, Kent J. Howard, X. Wu, Roy W. Chantrell, Dmitri Litvinov
Publikováno v:
Scopus-Elsevier
In this paper, an experimental and theoretical study of a continuous magnetic junction of the nanoscale size is presented. Such nanosize junction was created in a thin film Permalloy (Ni/Fe 80/20) layer via focused ion beam etching (FIB) etching. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7e5fcc05e68eef56f54bfabca6b46d35
http://www.scopus.com/inward/record.url?eid=2-s2.0-18544403074&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-18544403074&partnerID=MN8TOARS