Zobrazeno 1 - 10
of 147
pro vyhledávání: '"Kenneth W. Tobin"'
Autor:
Kenneth W. Tobin, Thomas P. Karnowski, Lloyd F. Arrowood, Regina K. Ferrell, Fred Lakhani, James S. Goddard
Publikováno v:
EURASIP Journal on Advances in Signal Processing, Vol 2002, Iss 7, Pp 704-713 (2002)
Image data management in the semiconductor manufacturing environment is becoming more problematic as the size of silicon wafers continues to increase, while the dimension of critical features continues to shrink. Fabricators rely on a growing host of
Externí odkaz:
https://doaj.org/article/2775202573b14e2fb585e7a44816281b
Publikováno v:
New Developments in Biomedical Engineering
Diabetic retinopathy is the leading cause of blindness in the Western world. The World Health Organisation estimates that 135 million people have diabetes mellitus worldwide and that the number of people with diabetes will increase to 300 million by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ca24a23c8f4ae884f4b527908f5a13e3
http://www.intechopen.com/articles/show/title/quality-assessment-of-retinal-fundus-images-using-elliptical-local-vessel-density
http://www.intechopen.com/articles/show/title/quality-assessment-of-retinal-fundus-images-using-elliptical-local-vessel-density
Autor:
Jeremy T Busby, S. Suresh Babu, A L Qualls, Lei Cao, Lonnie J. Love, Micah J. Hackett, W. David Pointer, William Arthur Wharton, Benjamin R. Betzler, Kenneth W. Tobin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee72a0efe7fbdfe8c508fec754b3368d
https://doi.org/10.2172/1490719
https://doi.org/10.2172/1490719
Autor:
Ziyu Xiao, Kenneth W. Tobin, Ayman I. Hawari, Hassina Z. Bilheux, K.K. Mishra, Philip R. Bingham
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 652:606-609
A neutron imaging facility is located on beam-tube #5 of the 1-MW PULSTAR reactor at North Carolina State University. An investigation of high resolution imaging using the coded source imaging technique has been initiated at the facility. Coded imagi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3530e8a33bdafe0a10fff871e63e11bc
https://doi.org/10.1016/j.nima.2010.10.049
https://doi.org/10.1016/j.nima.2010.10.049
Publikováno v:
The Imaging Science Journal. 54:200-210
This paper is an extension of previous work on the image segmentation of electronic structures on patterned wafers to improve the defect detection process on optical inspection tools. Die-to-die wafer inspection is based upon the comparison of the sa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::def37334754d39b22c600340d47ff5f4
https://doi.org/10.1179/174313106x110129
https://doi.org/10.1179/174313106x110129
Autor:
Kenneth W. Tobin, Thomas E. Potok, Thomas P. Karnowski, Paul J. Palathingal, Anil Cheriydat, Eddie A Bright, Jeffery R. Price, Budhendra L. Bhaduri
Publikováno v:
Photogrammetric Engineering & Remote Sensing. 72:531-540
We describe a method for indexing and retrieving high-resolution image regions in large geospatial data libraries. An automated feature extraction method is used that generates a unique and specific structural description of each segment of a tessell
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09a18152285c84a2ffc118f1f5b41e88
https://doi.org/10.14358/pers.72.5.531
https://doi.org/10.14358/pers.72.5.531
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 15:411-419
A model based on information theory, which allows yield managers to determine an optimal portfolio of yield analysis technologies for both the R&D and volume production environments, is presented. The information extraction per experimentation cycle
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7c3707e4689a78284cc88af917ba2624
https://doi.org/10.1109/tsm.2002.804876
https://doi.org/10.1109/tsm.2002.804876
Autor:
Fred Lakhani, Regina K. Ferrell, Thomas P. Karnowski, Lloyd F. Arrowood, Kenneth W. Tobin, James S. Goddard
Publikováno v:
EURASIP Journal on Advances in Signal Processing, Vol 2002, Iss 7, Pp 704-713 (2002)
Image data management in the semiconductor manufacturing environment is becoming more problematic as the size of silicon wafers continues to increase, while the dimension of critical features continues to shrink. Fabricators rely on a growing host of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::087611af4340f1abeff0a0be2f3ca40d
https://doaj.org/article/2775202573b14e2fb585e7a44816281b
https://doaj.org/article/2775202573b14e2fb585e7a44816281b
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 17:1369-1376
To be productive and profitable in a modern semiconductor fabrication environment, large amounts of manufacturing data must be collected, analyzed, and maintained. This includes data collected from in- and off-line wafer inspection systems and from t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e471930f0bed885382198ee7a98c7d8a
https://doi.org/10.1116/1.581822
https://doi.org/10.1116/1.581822
Publikováno v:
EMBC
Automated retina image analysis has reached a high level of maturity in recent years, and thus the question of how validation is performed in these systems is beginning to grow in importance. One application of retina image analysis is in telemedicin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4e614a4c4fd9281930c63a428cd280ae
https://pubmed.ncbi.nlm.nih.gov/24111391
https://pubmed.ncbi.nlm.nih.gov/24111391