Zobrazeno 1 - 1
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pro vyhledávání: '"Kenneth P. Foust"'
Autor:
Renzhi Liu, Asma Beevi K. T., Richard Dorrance, Timothy F. Cox, Rinkle Jain, Tolga Acikalin, Zhen Zhou, Tae-Young Yang, Johanny Escober-Pelaez, Shuhei Yamada, Kenneth P. Foust, Brent R. Carlton
Publikováno v:
IEEE Journal of Solid-State Circuits. 58:1285-1298
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::426fc18f843b77892aea3417ceb78b79
https://doi.org/10.1109/jssc.2022.3230002
https://doi.org/10.1109/jssc.2022.3230002
