Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Kenneth Ezukwoke"'
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-14 (2023)
Abstract Failure analysis has become an important part of guaranteeing good quality in the electronic component manufacturing process. The conclusions of a failure analysis can be used to identify a component’s flaws and to better understand the me
Externí odkaz:
https://doaj.org/article/6c03fe9c390d4c85954ed4ba8a8a9507
Autor:
Kenneth Ezukwoke, Houari Toubakh, Xavier Boucher, Pascal Gounet, Mireille Batton-Hubert, Anis Hoayek
Publikováno v:
IEEE 17th International Conference on Automation Science and Engineering (CASE)
IEEE 17th International Conference on Automation Science and Engineering (CASE), Aug 2021, Lyon, France. p 429-436
CASE
IEEE 17th International Conference on Automation Science and Engineering (CASE), Aug 2021, Lyon, France. p 429-436
CASE
International audience; Microelectronics production failure analysis is a time-consuming and complicated task involving successive steps of analysis of complex process chains. The analysis is triggered to find the root cause of a failure and its find
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::032cfcda7a65e7fb8ecaeefbecd04718
https://hal-emse.ccsd.cnrs.fr/emse-03325358
https://hal-emse.ccsd.cnrs.fr/emse-03325358
