Zobrazeno 1 - 1
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pro vyhledávání: '"Kenichiro Terui"'
Publikováno v:
Materials Science Forum. :631-634
The reaction behavior and growth kinetic of reaction layer were investigated in the Ni contact to n-type 6H-SiC. Annealing was performed at temperature in the range between 800 and 1000 °C for 1 to 240 minutes in Ar atmosphere. The interface reactio