Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Kenichi Shimbo"'
Autor:
Shin-ichiro Abe, Masanori Hashimoto, Wang Liao, Takashi Kato, Hiroaki Asai, Kenichi Shimbo, Hideya Matsuyama, Tatsuhiko Sato, Kazutoshi Kobayashi, Yukinobu Watanabe
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b11876ec56f88ab10a49e3bd537a5bcd
https://doi.org/10.1109/tns.2023.3280190
https://doi.org/10.1109/tns.2023.3280190
Publikováno v:
2017 IEEE 2nd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC).
This paper presents a Configuration RAM (CRAM) diagnosis macro achieving high-speed detection and correction of neutron-induced soft errors in static random access memory (SRAM)-type field-programmable gate arrays (FPGAs), and the design methodology
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ec2aad93f06a25e1d14fdb76a6a5094d
https://doi.org/10.1109/itnec.2017.8284809
https://doi.org/10.1109/itnec.2017.8284809
Publikováno v:
ATS
Technology scaling of semiconductor devices improves circuit performance but at the same time degrades a radiation-induced soft-error tolerance. The measurement of soft-error tolerance of devices is one of key technologies to guarantee quality reliab
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17ebccf5636c95d3fcc7611559e21646
https://doi.org/10.1109/ats.2016.36
https://doi.org/10.1109/ats.2016.36
Publikováno v:
IEEE Transactions on Electron Devices. 57:1527-1538
Trends in terrestrial neutron-induced soft-error in SRAMs from a 250 nm to a 22 nm process are reviewed and predicted using the Monte-Carlo simulator CORIMS, which is validated to have less than 20% variations from experimental soft-error data on 180
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ab894bc0515183c3ca0b02df0a72cf2
https://doi.org/10.1109/ted.2010.2047907
https://doi.org/10.1109/ted.2010.2047907
Publikováno v:
MCSoC
In this work, a network simulator is developed to predict the amount of hardware resources required for an embedded large-scale data processing system. It is difficult to simulate with the existing hardware simulator because the calculation time of p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62677a2654c22524d26ed686ac307ad9
https://doi.org/10.1109/mcsoc.2015.32
https://doi.org/10.1109/mcsoc.2015.32
Publikováno v:
TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C. 65:3499-3506
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4e93f95a2e13de86941b26df1cd27a1
https://doi.org/10.1299/kikaic.65.3499
https://doi.org/10.1299/kikaic.65.3499
Publikováno v:
TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C. 65:3906-3911
In this paper, an effective method for the nonlinear vibration analysis of rotor system is proposed by using the Component Mode Synthesis method and the Harmonic Balance Method. In that method, the system is divided into some components and the diffe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06b197eaf1a5b8eee75b6c611ac3343f
https://doi.org/10.1299/kikaic.65.3906
https://doi.org/10.1299/kikaic.65.3906
Publikováno v:
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
In this study, four types of microcontrollers (MCUs) operating under actual operating conditions, in which MCUs are regularly reset, are irradiated with white and quasi-monoenergetic neutron beams using our newly developed dynamic irradiation test en
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e37698b27dc591bbfd7e93e45e1abeb8
https://doi.org/10.1109/radecs.2013.6937418
https://doi.org/10.1109/radecs.2013.6937418
Publikováno v:
IOLTS
In-depth study on environmental radiation spectra of neutrons, protons, muons, electrons, gamma rays are carried out. Soft-error rates in 130nm SRAMs are estimated based on the survey results with the following conclusions: (1) Charge deposition by m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::854ec0b7ad8331277e11322b037d4194
https://doi.org/10.1109/iolts.2012.6313840
https://doi.org/10.1109/iolts.2012.6313840
Publikováno v:
2011 International Reliability Physics Symposium.
As semiconductor device scaling is on-going far below 100nm design rule, terrestrial neutron-induced soft-error typically in SRAMs is predicted to be worsen furthermore. Moreover, novel failure modes that may be more serious than those in memory soft
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a59308ebfeba72c5b24180fed907905f
https://doi.org/10.1109/irps.2011.5784483
https://doi.org/10.1109/irps.2011.5784483