Zobrazeno 1 - 2
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pro vyhledávání: '"Kenichi Nagatani"'
Autor:
Kenichi Nagatani
Publikováno v:
2018 China Semiconductor Technology International Conference (CSTIC).
A signal with a jitter in excess of one unit interval will result in a failure of functional testing because the signal and its expected data are misaligned. Additionally, jitter measurements performed without considering the correct jitter transfer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54e2472c81bba4d4dfa1862fa39a9013
https://doi.org/10.1109/cstic.2018.8369266
https://doi.org/10.1109/cstic.2018.8369266
Publikováno v:
ITC
Recently, there is an increasing need for methods of functionally testing RF devices to provide lower cost alternatives to testing RF communication systems. In this paper, a real-time functional testing method of RF-ICs using a digital tester is prop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8aa567012dd32807dfe8b0685d58a986
https://doi.org/10.1109/test.2013.6651909
https://doi.org/10.1109/test.2013.6651909