Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Kenichi Maruko"'
Autor:
Zhiwei Zhou, Jeremy Chatwin, Ryota Shinoda, Ueno Yosuke, Koki Uchino, Jacob Adams Wysocki, Hideyuki Suzuki, Norio Shoji, Masuda Takashi, Kenichi Maruko, Yoshifumi Miyajima
Publikováno v:
IEEE Journal of Solid-State Circuits. 51:3204-3215
A wide band, low power, injection-locked oscillator (ILO)-type clock and data recovery (CDR) with high jitter tolerance is implemented in 28 nm CMOS. A robust phase and frequency detection algorithm independently controls ILO free running frequency a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6c97e452a2265196b0f8039ef8b7999
https://doi.org/10.1109/jssc.2016.2594077
https://doi.org/10.1109/jssc.2016.2594077
Autor:
Ueno Yosuke, Hideyuki Suzuki, Norio Shoji, Hideyuki Matsumoto, Zhiwei Zhou, Masuda Takashi, Jeremy Chatwin, Jacob Adams Wysocki, Kenichi Maruko, Koki Uchino, Yoshifumi Miyajima, Ryota Shinoda
Publikováno v:
ISSCC
The consumer electronics market demands high-speed and low-power serial data interfaces. The injection locked oscillator (ILO) based clock and data recovery (CDR) circuit [1–2], is a well-known solution for these demands. The typical solution has a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ef5f4457146a9f7c2f00d273f59b697
https://doi.org/10.1109/isscc.2016.7417970
https://doi.org/10.1109/isscc.2016.7417970
Autor:
Hiroshi Shiroshita, Sachiya Tanaka, Yuki Yagishita, Hiroki Kihara, Toshiyuki Ogata, Hiroaki Hayashi, Kenichi Maruko, Kenji Konda, Tatsuya Sugioka, Takayuki Aoki, Masahiro Sato, Taichi Niki, Hironobu Konishi, Yasunori Tsukuda, Zhiwei Zhou, Hisashi Owa, Takeshi Ogura
Publikováno v:
ISSCC
Since the I/O bandwidth demand for mobile consumer electronics has been growing rapidly, the importance of high-speed low-power I/O links has also been increasing. Among proposed I/O architectures, [1] and [2] are attractive solutions. However, for a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b23ccf96703ac04300720a67b27dfd3f
https://doi.org/10.1109/isscc.2010.5433821
https://doi.org/10.1109/isscc.2010.5433821