Zobrazeno 1 - 10
of 467
pro vyhledávání: '"Kenesei, P."'
Autor:
Zheng, Weijian, Park, Jun-Sang, Kenesei, Peter, Ali, Ahsan, Liu, Zhengchun, Foster, Ian T., Schwarz, Nicholas, Kettimuthu, Rajkumar, Miceli, Antonino, Sharma, Hemant
High-energy X-ray diffraction methods can non-destructively map the 3D microstructure and associated attributes of metallic polycrystalline engineering materials in their bulk form. These methods are often combined with external stimuli such as therm
Externí odkaz:
http://arxiv.org/abs/2312.03989
Autor:
Kisiel, Elliot, Poudyal, Ishwor, Kenesei, Peter, Engbretson, Mark, Last, Arndt, Basak, Rourav, Zaluzhnyy, Ivan, Goteti, Uday, Dynes, Robert, Miceli, Antonino, Frano, Alex, Islam, Zahir
Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as mag
Externí odkaz:
http://arxiv.org/abs/2212.07303
Autor:
Yaozhong Zhang, Mohammadreza Yaghoobi, Yueheng Zhang, Daniel Rubio-Ejchel, Peter Kenesei, Jun-Sang Park, Anthony D. Rollett, Jerard V. Gordon
Publikováno v:
Journal of Materials Research and Technology, Vol 30, Iss , Pp 8792-8804 (2024)
The three-dimensional grain-averaged response of solid bar samples under non-proportional (NP) elastoplastic axial-torsional loading was investigated using in situ high energy diffraction microscopy (HEDM) and companion crystal plasticity finite elem
Externí odkaz:
https://doaj.org/article/6ccf9b12807747c1bdb8e794b8b2c395
Autor:
Ali, Ahsan, Sharma, Hemant, Kettimuthu, Rajkumar, Kenesei, Peter, Trujillo, Dennis, Miceli, Antonino, Foster, Ian, Coffee, Ryan, Thayer, Jana, Liu, Zhengchun
Publikováno v:
2022 IEEE International Conference on Cluster Computing (CLUSTER)
Extracting actionable information rapidly from data produced by instruments such as the Linac Coherent Light Source (LCLS-II) and Advanced Photon Source Upgrade (APS-U) is becoming ever more challenging due to high (up to TB/s) data rates. Convention
Externí odkaz:
http://arxiv.org/abs/2204.09805
Publikováno v:
Phys. Rev. Applied 18, 014076 (2022)1-8)
Increasing power densities in integrated circuits has led to an increased prevalence of thermal hotspots in integrated circuits. Tracking these thermal hotspots is imperative to prevent circuit failures. In 3D integrated circuits, conventional surfac
Externí odkaz:
http://arxiv.org/abs/2203.12554
Autor:
Xuan Zhang, Christopher P. Carter, Yashas Satapathy, Aniket Tekawade, Jun-Sang Park, Peter Kenesei, Meimei Li
Publikováno v:
Materials Research Letters, Vol 11, Iss 10, Pp 806-813 (2023)
Additively manufactured (AM) 316L stainless steel (SS) has been reported to have low creep resistance compared to its conventionally made counterparts. Herein, we quantitatively characterized the voids in a creep-ruptured AM 316L SS specimen and thos
Externí odkaz:
https://doaj.org/article/3d37d992ca694e29ae08ed71a11e9cbe
Autor:
Liu, Zhengchun, Ali, Ahsan, Kenesei, Peter, Miceli, Antonino, Sharma, Hemant, Schwarz, Nicholas, Trujillo, Dennis, Yoo, Hyunseung, Coffee, Ryan, Layad, Naoufal, Thayer, Jana, Herbst, Ryan, Yoon, ChunHong, Foster, Ian
Extremely high data rates at modern synchrotron and X-ray free-electron laser light source beamlines motivate the use of machine learning methods for data reduction, feature detection, and other purposes. Regardless of the application, the basic conc
Externí odkaz:
http://arxiv.org/abs/2105.13967
Publikováno v:
Foods, Vol 13, Iss 13, p 2115 (2024)
The increasing global demand for meat production, driven by a rapidly expanding population and changing dietary preferences has prompted the search for protein-rich, sustainable, and healthier meat alternatives. In this context, edible mushrooms are
Externí odkaz:
https://doaj.org/article/ac81e49f935a4fc38f3773437e009e41
Autor:
Lucas, Mariana Mar, Ramos, Tiago, Jørgensen, Peter S., Canulescu, Stela, Kenesei, Peter, Wright, Jonathan, Poulsen, Henning F., Andreasen, Jens W.
We demonstrate a non-destructive approach to provide structural properties on the grain level for the absorber layer of kesterite solar cells. Kesterite solar cells are notoriously difficult to characterize structurally due to the co-existence of sev
Externí odkaz:
http://arxiv.org/abs/2012.12598
Autor:
Liu, Zhengchun, Sharma, Hemant, Park, Jun-Sang, Kenesei, Peter, Miceli, Antonino, Almer, Jonathan, Kettimuthu, Rajkumar, Foster, Ian
X-ray diffraction based microscopy techniques such as High Energy Diffraction Microscopy rely on knowledge of the position of diffraction peaks with high precision. These positions are typically computed by fitting the observed intensities in area de
Externí odkaz:
http://arxiv.org/abs/2008.08198