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pro vyhledávání: '"Ken V. Falch"'
Autor:
Tang Li, Maik Kahnt, Thomas L. Sheppard, Runqing Yang, Ken V. Falch, Roman Zvagelsky, Pablo Villanueva‐Perez, Martin Wegener, Mikhail Lyubomirskiy
Publikováno v:
Advanced Science, Vol 11, Iss 30, Pp n/a-n/a (2024)
Abstract Hard X‐rays are needed for non‐destructive nano‐imaging of solid matter. Synchrotron radiation facilities (SRF) provide the highest‐quality images with single‐digit nm resolution using advanced techniques such as X‐ray ptychograp
Externí odkaz:
https://doaj.org/article/35929a5ba27b437389a7fec3dc720a7b
