Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Ken Sills"'
Publikováno v:
Machine Vision and Applications. 25:377-388
In many industrial applications, it is important to identify defects on specular surfaces. On machined surfaces, defect identification may be further complicated by the presence of marks from a machining process. These marks may dramatically and unpr
Autor:
J. I. Budnick, D. M. Potrepka, A. A. Antonov, Anatoly I. Frenkel, Steve M. Heald, Ken Sills, D. I. Brewe, M. Daniel, I. K. Grigorieva, Douglas M. Pease, C. Nelson, M. Hammes, T. Rhodes
Publikováno v:
Review of Scientific Instruments. 71:3267-3273
We have constructed an x-ray monochromator based on a log spiral of revolution covered with highly oriented pyrolytic graphite. Such a monochromator is used for obtaining x-ray absorption edge fine structure by the fluorescence method, and is particu
Publikováno v:
CRV
Specular surfaces pose difficulties for machine vision. In some applications, this may be further complicated by the presence of marks from a machining process. We propose a system that directly illuminates machined specular surfaces with a programma
Publikováno v:
The Astrophysical Journal. 445:148
The sensitivity of the solar g-mode oscillation spectrum to variability in the universal gravitational constant G is described. Solar models in varying G cosmologies were constructed by evolving a zero-age main-sequence stellar model to the Sun's cur