Zobrazeno 1 - 10
of 50
pro vyhledávání: '"Ken Mingard"'
Publikováno v:
Powder Metallurgy. 64:97-107
High-temperature properties of hardmetals are critical to their use in many applications but a challenge to measure accurately. Creep behaviour is not well understood so this work has studied uniax...
Autor:
Mark Stewart, Ken Mingard, David J. H. Cant, Alexander G. Shard, Caterina Minelli, Yiwen Pei, Rasmus Havelund, Martin P. Seah
Publikováno v:
The Journal of Physical Chemistry C. 124:23752-23763
The ability to measure the internal chemical distribution of particles is of significant benefit to the development and testing of products relevant to the pharmaceutical, agrichemical, and food in...
Publikováno v:
Journal of Microscopy. 277:79-92
We present a comparison of the precision of different approaches for orientation imaging using electron backscatter diffraction (EBSD) in the scanning electron microscope. We have used EBSD to image the internal structure of WC grains, which contain
Autor:
Helen Jones, Vivian Tong, Rajaprakash Ramachandramoorthy, Ken Mingard, Johann Michler, Mark Gee
Publikováno v:
International Journal of Refractory Metals and Hard Materials. 107:105875
Publikováno v:
Surface and Coatings Technology. 442:128233
Autor:
Rajaprakash Ramachandramoorthy, H.G. Jones, Vivian Tong, Mark Gee, Ken Mingard, Johann Michler
Tungsten carbide cobalt hardmetals are commonly used as cutting tools subject to high operation temperature and pressures, where the mechanical performance of the tungsten carbide phase affects the wear and lifetime of the material. In this study, th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1012fe6bec0fc71321a5fbcf01214db5
http://arxiv.org/abs/2101.04374
http://arxiv.org/abs/2101.04374
Autor:
F. Mehnke, A. Alasmari, T. Wernicke, Aimo Winkelmann, Elena Pascal, L. Jiu, S. Hagedorn, Philip A. Shields, B.M. Jablon, W. Avis, Paul R. Edwards, Peter J. Parbrook, M. Nouf-Allehiani, Y. Gong, C. Kuhn, Yonghao Zhang, Gunnar Kusch, Robert W. Martin, Michael Kneissl, Jochen Bruckbauer, Benjamin Hourahine, S. Vespucci, Tao Wang, S. Kraeusel, J. Enslin, R. McDermott, P. M. Coulon, G. Naresh-Kumar, Carol Trager-Cowan, M. D. Smith, Sebastian Walde, R. M. Smith, Markus Weyers, Roy L. Johnston, Arne Knauer, Ken Mingard, David M. Thomson
In this article we describe the scanning electron microscopy (SEM) techniques of electron channelling contrast imaging and electron backscatter diffraction. These techniques provide information on crystal structure, crystal misorientation, grain boun
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ec5daaf27a3bb173a9ce0f9885b89bc6
https://strathprints.strath.ac.uk/74728/7/Trager_Cowan_etal_IOPCS_MSE_2020_Advances_in_electron_channelling_contrast_imaging_and_electron_backscatter_diffraction.pdf
https://strathprints.strath.ac.uk/74728/7/Trager_Cowan_etal_IOPCS_MSE_2020_Advances_in_electron_channelling_contrast_imaging_and_electron_backscatter_diffraction.pdf
Autor:
A. Alasmari, G. Naresh-Kumar, Ken Mingard, Gunnar Kusch, Robert W. Martin, Paul R. Edwards, Carol Trager-Cowan
Understanding defects and their roles in plastic deformation and device reliability is important for the development of a wide range of novel materials for the next generation of electronic and optoelectronic devices. We introduce the use of gaseous
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::024f1e4afad2e32e5eafbbd72a5887ed
https://strathprints.strath.ac.uk/72016/1/Naresh_Kumar_eta_Ultramicroscopy_2020_Metrology_of_crystal_defects_through_intensity_variations_in_secondary_electrons.pdf
https://strathprints.strath.ac.uk/72016/1/Naresh_Kumar_eta_Ultramicroscopy_2020_Metrology_of_crystal_defects_through_intensity_variations_in_secondary_electrons.pdf
Autor:
Jochen Bruckbauer, Ben Hourahine, William Avis, Angus J. Wilkinson, M. Nouf-Allehiani, Ken Mingard, David J. Thomson, Albes Kotzai, Ryan McDermott, Gunnar Kusch, Robert W. Martin, Dale Waters, Arantxa Vilalta-Clemente, Paul R. Edwards, Aeshah Alasamari, Aimo Winkelmann, Peter J. Parbrook, Carol Trager-Cowan, G. Naresh-Kumar, Elena Pascal
Publikováno v:
Gallium Nitride Materials and Devices XV.
Autor:
Ken Mingard, G. Naresh-Kumar, B.M. Jablon, Aimo Winkelmann, Benjamin Hourahine, Carol Trager-Cowan
In this study, electron channelling contrast imaging (ECCI) and electron backscatter diffraction (EBSD) have been used to examine the substructure and dislocations in tungsten carbide (WC) grains in tungsten carbide‑cobalt (WC-Co) hardmetals. These
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b49f9b1a65230e4e6b5b308baa688b6d
https://strathprints.strath.ac.uk/70604/1/Jablon_etal_IJRMHM2019_Subgrain_structure_and_dislocations_in_WC_Co_hard_metals_revealed.pdf
https://strathprints.strath.ac.uk/70604/1/Jablon_etal_IJRMHM2019_Subgrain_structure_and_dislocations_in_WC_Co_hard_metals_revealed.pdf